Anritsu Corporation

Yuichi Tsuiki

Yoshitaka Kihara

Takahiro Kasagi

Kengo Kikuchi

Koji Fukazawa

Custodio Jean-Elaine Garcia

Tsubasa Takahashi

Takato Tokuyama

A first shift unit () that shifts an amplitude value of the I baseband signal and an amplitude value of the Q baseband signal in a lower direction by the predetermined number of bits so that the predetermined number of lower bits thereof have a value after a decimal point, a first rounding unit () that rounds-to-even the amplitude value of the I baseband signal and the amplitude value of the Q baseband signal shifted by the first shift unit () with a rounding width of 1 in decimal notation, and a first averaging unit () that respectively calculates a time average of the amplitude value of the I baseband signal and the amplitude value of the Q baseband signal rounded by the first rounding unit () are included.

Mobile terminal test device and mobile terminal test method

A measurement device and a measurement method capable of performing measurement on a device under test while maintaining a desired high data rate even under poor communication conditions such as occurrence of retransmission of a frame from a device under test in a wireless communication connection are provided. The measurement device includes a reception unitthat receives a frame transmitted from a DUT, a determination unitthat determines whether or not a header of the frame has been normally received by the reception unit, an acknowledgment transmission unitthat transmits the acknowledgment frame to the DUTwhen the determination unitdetermines that the header has been normally received by the reception unit; and a measurement unitthat performs the measurement on the frame determined by the determination unitthat the header has been normally received by the reception unit

Measurement device and measurement method

Growing community of inventors

Atsugi, Japan

Yuichi Tsuiki