Murata Manufacturing Co., Ltd.

Tohoku University

Adv Antest Corporation

Kyoto University

Nec Corporation

Sharp Kabushiki Kaisha Corporation

Panasonic Corporation

Rohm Co., Ltd.

Arkray, Inc.

National Institute of Information and Communications Technology, Incorporated

Yuichi Ogawa

Takashi Kondo

Seiji Kamba

Shinichiro Hayashi

Eiji Kato

Kazuhiro Takigawa

Jun Ozawa

Yumiko Kato

Naoki Oda

Koji Tanaka

Yumi Wakita

Toshikazu Mukai

Takeshi Mitsunaka

Masashi Okamoto

Iwao Hosako

Naoshi Kondo

Tetsuhito Suzuki

Norihiko Sekine

Sakura Tomita

A bioparticle observation apparatus includes a dielectrophoresis electrode that outputs a first signal causing a dielectrophoresis force to act on a bioparticle, a sensor electrode that detects an impedance difference between the bioparticle and the liquid, and a control circuit that controls the first signal so that the detected impedance difference is fixed.

Bioparticle observation apparatus and bioparticle observation method

An elapsed-time determination apparatus includes: a storage unit that stores correlation information indicating a correlation between a state of a melanophore of a fish and an amount of time elapsed since the death of the fish; an acquisition unit that acquires an image of a fish; an analysis unit that detects a state of a melanophore of a fish by analyzing an image acquired by the acquisition unit; and a determination unit that determines the amount of time elapsed since the death of the fish in accordance with the state of the melanophore of the fish detected by the analysis unit, based on the correlation information, and outputs determination results.

Elapsed-time determination apparatus, deciding apparatus, deciding method, and non-transitory computer-readable recording medium storing control program

There is provided solution testing equipment which can detect an output variation of a THz oscillation device using a THz wave (h&#x3bd;) by contacting a liquid or cells on an RTD oscillation device, and can reduce the size and weight thereof. The solution testing equipment includes: a THz oscillation device configured to radiate the THz wave I; a THz detection device configured to receive the THz wave I; and a solution as a test object disposed on the THz oscillation device, in which the solution is tested on the basis of output characteristics of the terahertz wave varying in response to a relative permittivity of the solution.

Solution testing equipment

The characteristics of a specimen are measured by holding the specimen on an aperture array structure having apertures, applying an electromagnetic wave to the aperture array structure, and detecting frequency characteristics of the electromagnetic wave reflected by the aperture array structure. A liquid is directly or indirectly attached to at least a part of a first principal surface. The electromagnetic wave is applied from side including a second principal surface. The apertures of the aperture array structure have a size which does not allow the liquid to leak from the first principal surface side to the second principal surface side, and the liquid is attached to the first principal surface of the aperture array structure in a state open to an atmosphere under air pressure.

Specimen measuring method

An aperture array structure used in a method of measuring characteristics of a specimen by applying an electromagnetic wave to an aperture array structure on which the specimen is held, and detecting frequency characteristics of the electromagnetic wave scattered by the aperture array structure. The aperture array structure includes a first principal surface, a second principal surface opposed to the first principal surface, and a plurality of apertures extending through the aperture array structure in a direction perpendicular to the first principal surface and the second principal surface. An opening area of each aperture at the first principal surface is smaller than an opening area of each aperture at the second principal surface.

Aperture array structure and measurement method using the same

In order to generate a two-dimensional image of a sample in a short time using THz waves, provided is a reflective imaging device including a sample holder, a THz wave light source, a THz wave camera, a rotation mechanism for rotating the holder and the camera, and a processing unit. A sample unit includes an incidence member, a sample, and a reflection member. The sample includes a first region of only a membrane and a second region including a biopolymer. The camera detects, with regard to respective incident angles, a THz wave in which interference occurs between a component reflected at an interface between the incidence member and the sample and a component reflected at an interface between the sample and the reflection member, of each portion of the sample unit, and outputs a signal. The processing unit specifies an incident angle at which a signal of a first THz wave that interferes in the first region is relatively small and a signal of a second THz that interferes in the second region is relatively large, and generates a two-dimensional image of the sample based on the signal from the camera with regard to the specified incident angle.

Reflective imaging device and image acquisition method

A measurement method that includes irradiating a void-arranged structure on which an analyte has been held with an electromagnetic wave, detecting an electromagnetic wave scattered on the void-arranged structure, and determining a property of the analyte on the basis of at least one parameter, the parameter including the amount of change in the ratio of the detected electromagnetic wave to the irradiated electromagnetic wave at a specific frequency between the presence and the absence of the analyte.

Method for measurement of properties of analyte

A sample analysis method is provided for analyzing a sample having a permeability to terahertz radiation and accurately measure the composition, physical properties, mass and dimensions of a very small sample or a minute amount of sample by irradiating the sample with terahertz radiation. In the method, a reflective member is provided adjoining a first principal surface of the sample, an entrance member is provided adjoining a second principal surface of the sample, terahertz radiation is delivered from outside of entrance member towards the sample, and the sample is analyzed using an interference wave generated from a first-surface reflected wave at the interface between the first principal surface of the sample and the reflective member and a second-surface reflected wave at the interface between the second principal surface of the sample and the entrance member.

Sample analysis method

There is provided a measuring apparatus including a space arrangement structure that includes space regions surrounded by conductors in a plane, an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, and an electromagnetic wave detector that measures the electromagnetic waves that have passed through the space arrangement structure. Here, characteristics of the object are measured by measuring the electromagnetic waves that have passed through the space arrangement structure. The electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle, and the electromagnetic waves that have passed through the space arrangement structure are measured.

Measurement apparatus and measurement method

A method of attaching an object to be measured to a structure causing a diffraction phenomenon; irradiating the structure to which the object to be measured is attached and which causes the diffraction phenomenon with an electromagnetic wave; detecting the electromagnetic wave scattered by the structure causing the diffraction phenomenon; and measuring a characteristic of the object to be measured from the frequency characteristic of the detected electromagnetic wave. The object to be measured is attached directly to the surface of the structure causing the diffraction phenomenon. Thus, the method for measuring the characteristic of an object to be measured exhibits an improved measurement sensitivity and high reproducibility. A structure causing a diffraction phenomenon and used for the method, and a measuring device are provided.

Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring device

Terahertz wave measuring apparatus having space arrangement structure and measuring method

A pelletfor use in spectrometry includes a first powderof a light transmitting material in a compression-molded form, and a second powderwhich is hydrophilic and water-insoluble and is dispersedly mixed in the first powder. A sampleto be subjected to spectrometry is e.g. in a powdery form and dispersedly mixed in the first and the second powdersand. When the sampleis a hydrate, the second powderexerts the effect of accelerating dehydration of the sample, so that stable spectrum data on the sample in the dehydrated state is obtained early. This makes it possible to perform a processing such as identification of the sampleearly and precisely.

Growing community of inventors

Kyoto, Japan

Yuichi Ogawa