Kabushiki Kaisha Toshiba

Smk Corporation

Ebara Corporation

Nippon Steel Corporation

Joled Inc.

Citizen Holdings Company, Ltd.

Toshiba Energy Systems & Solutions Corporation

Ohi Seisakusho Co., Ltd.

Nissan Motor Company Limited

Sharp Nec Display Solutions, Ltd.

Citizen Systems Japan Co., Ltd.

Satori S-tech Co., Ltd.

Nissan Motor Corp.

Mahle International Gmbh

Mahle Filter Systems Japan Corporation

Yuichi Kato

Kouta Nakata

Yasunori Taguchi

Susumu Naito

Osamu Nabeya

Haruo Yoshida

Yosuke Sakai

Tomoko Owada

Kenichi Akazawa

Tomoatsu Kinoshita

Takashige Fujimori

Toshio Aoki

Shingo Togashi

Satoru Yamaki

Kentaro Takagi

Shinya Tominaga

Makoto Fukushima

Ryoji Shimura

Mikio Yamanaka

Masayasu Ito

Satoshi Ogihara

Atsushi Nonaka

Yuichiro Ishiyama

Hidehiko Sumitomo

Keiichi Ohmura

Hideki Shimizu

Masayuki Kasuya

Naotsugu Yoshida

Shin Yoshida

Kenzo Sawada

Daizo Ito

Masamitsu Wakoh

Katsuhiko Yui

Katsuhisa Ohta

Cheng Cheng

Kenta Masuda

Keiichi Akamatsu

Fumio Fudanoki

Ryuichi Hiratsuka

Masuhiro Fukaya

Tomohiro Ando

Masatsugu Uehara

Takafumi Shibata

Takahiro Kawada

Ryota Miyake

Chikashi Miyamoto

Wataru Murata

Yasuhiro Kageyama

Junichi Kinoshita

Takashi Ishizawa

Hitoshi Ota

Issei Miyamoto

Haruo Kitamura

Isaku Nagura

Eiichi Ookuma

Koji Kikuchi

Jun Nakatuka

Jun Araki

Kazuo Suzuki

Ichiro Okamoto

Tetsuo Nakamura

Daijiro Mizukoshi

Naoyuki Takado

Kozue Ikeuchi

Yusuke Terakado

A scum adsorbing member provided in a twin roll continuous casting device to produce a slab by supplying a molten metal to a molten metal storage section formed by a pair of rotatable cooling rolls and a pair of side weirs, and forming and growing a solidified shell on each circumferential surface of the pair of cooling rolls, so that a part of the scum adsorbing member is immersed in the molten metal storage section includes a refractory containing a refractory metal oxide, wherein the scum adsorbing member has 15% by volume or more and 70% by volume or less of pores.

Scum adsorbing member, twin roll continuous casting device, and method of producing slab

An image display device is provided that allows easy adjustment of positional deviation in an optical axis direction of an optical modulation element from the outside. The image display device includes: a housing including an operation surface; an optical modulation element that is housed in the housing and that includes an image-forming surface that modulates light to form an image; a holding portion that movably holds the optical modulation element at least in a direction perpendicular to the image-forming surface; and an adjusting portion including at least one wire member, one end of the wire member being connected to the holding portion and the other end rotatably attached to the operation surface. Holding portion includes a movable portion that is moved in a direction perpendicular to the image-forming surface by the rotation of the other end of the wire member.

Image display device

According to one embodiment, a data processing apparatus includes a processor. The processor calculates, from the first measurement data, a first differential value set that is a set of first differential values in a time direction at a time included in the first period of the measurement values of the sensor of interest. The processor calculates, from the second measurement data, a second differential value set that is a set of second differential values in a time direction at a time included in the second period of the measurement values of the sensor of interest. The processor generates a first differential value distribution and a second differential value distribution using the second differential value set.

Data processing apparatus, method, and program

Elastic membrane

According to one embodiment, a monitoring apparatus includes a processing circuit. The processing circuit is configured to generate second data including a prediction value of a second sensor correlated with a first sensor from first data including a measurement value of the first sensor of which a measurement value changes suddenly in a case where the control signal changes, detect an anomaly of the system or an anomaly of at least one sensor, and make it difficult to detect the anomaly in a case where the determination signal indicates that there is a change in the control signal.

Monitoring apparatus, method, and program

According to an embodiment, a learning device includes a memory and one or more processors coupled to the memory. The one or more processors are configured to: generate a transformation matrix from learning data in which feature quantities and target values are held in a corresponding manner; and learn about parameters of a neural network which includes nodes equal in number to the number of rows of the transformation matrix, a first output layer representing first estimation distribution according to the values of the nodes, and a second output layer representing second estimation distribution decided according to the product of the transformation matrix and the first estimation distribution.

Learning device, inference device, learning method, and inference method using a transformation matrix generated from learning data

According to one embodiment, an information processing apparatus includes a processing circuit. The processing circuit calculates a first input/output error related to normal data and a second input/output error related to pseudo abnormal data different from the normal data, for each of a plurality of autoencoders having different network structures. The processing circuit outputs relational data indicating a relation between the network structure and the first input/output error and the second input/output error.

Information processing apparatus, information processing method, and storage medium

A polishing head capable of preventing contact between both side walls of an elastic membrane when a negative pressure is formed in a pressure chamber formed by the elastic membrane. The polishing head includes: a first elastic membrane configured to press the workpiece against the polishing pad; a retainer ring surrounding the first elastic membrane; a second elastic membrane configured to press the retainer ring against the polishing pad; a carrier to which the first elastic membrane is secured; and an attachment member arranged in a pressure chamber formed by the second elastic membrane and fixing the second elastic membrane to the carrier. The attachment member has a support portion extending toward the retainer ring along a side wall of the second elastic membrane.

Polishing head and polishing apparatus

According to an embodiment, a monitoring apparatus configured to generate time-series predicted data based on time-series measured data and a prediction model that generates predicted data including one or more predicted values predicted to be output from one or more sensors; and generate, for a first sensor among the one or more sensors, a displayed image including a measured value graph representing a temporal change in a measured value included in the time-series measured data in a second period after a first period, a predicted value graph representing a temporal change in a predicted value included in time-series predicted data in the second period, past distribution information representing a distribution of a measured value in the first period, and measurement distribution information representing a distribution of the measured value included in the time-series measured data in the second period.

Monitoring apparatus, monitoring method, computer program product, and model training apparatus

Elastic membrane for semiconductor wafer polishing apparatus

An abnormality determination device includes one or more processors. The processors input first input data to a first model to obtain first output data. The first output data is formed by restoring data with the reduced dimension to data with the same dimension as that of the first input data. The processors input second input data, which is a difference between the first input data and the first output data, to a second model, and obtain second output data. The second output data is formed by restoring data with the reduced dimension to data with the same dimension as that of the second input data. The processors obtain restored data that is a sum of the first output data and the second output data. The processors compare the first input data with the restored data and determine an abnormality in the first input data based on the comparison result.

Abnormality determination device, learning device, and abnormality determination method

A method of manufacturing a flexible device includes joining a first surface of a support substrate to a back surface of a flexible substrate, the first surface being opposite to a second surface of the support substrate; forming an element layer on a front surface of the flexible substrate; and performing multidirectional oblique irradiation of an interface and its vicinity between the support substrate and the flexible substrate with laser light from the second surface of the support substrate to detach the support substrate from the flexible substrate.

Method of manufacturing flexible device using multidirectional oblique irradiation of an interface between a support substrate and a flexible substrate

There is provided a semiconductor device that includes a substrate, an electric field shielding layer, and a semiconductor element. The electric field shielding layer is provided on the substrate. The semiconductor element includes an electrode, and is provided on the electric field shielding layer with an insulating film in between.

Semiconductor device, display unit, method of manufacturing display unit, and electronic apparatus

Growing community of inventors

Tokyo, Japan

Yuichi Kato