Academia Sinica

United Microelectronics Corp.

Yuh-Lin Wang

Huai-Hsien Wang

Yong-fen Hsieh

Juen-Kai Wang

Lung-Wen Chen

Ting-Yu Liu

Pai-Chia Kuo

Yunn-Shin Shiue

Chih-Ting Chen

Chih-Yi Liu

A surface-enhanced Raman spectroscopic (SERS) system for detecting a biomolecule. The system includes a substrate, an array of nanoparticles disposed on the substrate, each being partially embedded in the substrate and having a non-embedded surface, and a linking agent disposed on the non-embedded surface of each of the nanoparticles. The array of nanoparticles has a uniform interparticle gap of 1-50 nm and the linking agent is capable of binding to the biomolecule.

Glycopeptide-functionalized nanoparticles arrays for capturing and detecting biomolecules

The present invention provides an on-chip thin film phase plate for a releasing charging, comprising a chip substrate having one or more apertures; and a thin film layer attached to the top surface of the chip substrate. The present invention also provides a method for observing organic material by TEM, which uses the above-mentioned on-chip thin film phase plate in a TEM system.

On-chip thin film Zernike phase plate and applications thereof

This invention relates to methods of preparing substrates that enhance the Raman signal of analytes in surface-enhanced Raman spectroscopy (SERS). The SERS-active substrate comprises an array of metal nanoparticles at least partially embedded in a template. The substrate's uniform and readily reproducible SERS-active properties with a wide range of analyte concentrations substantially enhance the power and utility of SERS. This invention also provides sensors, as well as Raman instruments, comprising the SERS-active substrates.

Substrate for surface-enhanced raman spectroscopy, sers sensors, and method for preparing same

An apparatus and a method of producing a dual ion/electron source. The ion beam and the electron beam are produced by a charged particle optical system. Using an ion source metal to emit an ion beam or an electron beam. The direction of the ion beam and the electron beam is identical. Neither the particle source nor the sample need to be rotated or shifted.

Apparatus and method of producing dual ion/electron source

Growing community of inventors

Taipei, Taiwan

Yuh-Lin Wang