Nantong Institute of Nanjing University of Posts and Telecommunications Co.,ltd.

Nanjing University of Posts and Telecommunicatins

Yufeng Guo

Zhikuang Cai

Zixuan Wang

Jiafei Yao

Henglu Wang

Jian Xiao

Binbin Xu

Jingjing Guo

Zushuai Xie

Guopeng Zhou

Jian Song

Lu Liu

Wenhua Lin

Xuanchen Qi

Haijun Shen

Chen Li

Xin Wang

Ming Wang

Hang Yang

Xiaoting Liu

Luping Zhang

Dapeng Yan

Haiyan Sun

Haojie Yu

Yunbo Wang

Hongqiang Zhu

Zhenghao Zhao

Guowei Shi

Ji Wang

Jingqi Yao

Xun Xu

Disclosed in the present invention is a crystal oscillator based on duty ratio measurement, comprising a first inverter, a resistor, a first load capacitor, a second load capacitor, first to fourth switches, a quartz crystal, a buffer, a sampling and holding module, a first comparator, a second comparator, a phase conversion module, a digital control module, and an energy injection module. One end of the quartz crystal is used for signal injection, a signal at the other end of the quartz crystal is sampled and processed, information representing phase error accumulation, i.e., a signal of which the duty ratio is continuously changing, is obtained by means of the first comparator, and finally the duty ratio is measured by means of the phase conversion module and the second comparator, so as to obtain an accurate moment of phase switching.

Crystal oscillator based on duty ratio measurement

A low-power-consumption low-voltage digital temperature sensor, which acquires temperature information by means of the frequency ratio of a first oscillation signal outputted by a first annular oscillator to a second oscillation signal outputted by a second annular oscillator. The first annular oscillator additionally uses an MOS varactor as a load capacitor, and uses the voltage characteristics of the MOS varactor to lower the power supply voltage fluctuation sensitivity, which is suitable for a low-power-consumption low-voltage environment; meanwhile, the sensor has the advantages of a small size, high digitization, self referencing and the like.

Low-power-consumption low-voltage digital temperature sensor

A reconfigurable MBIST method based on an adaptive March algorithm is provided. The reconfigurable MBIST method automatically reconfigures different algorithm circuits according to external environment and user instructions to satisfy detection requirements for different faults. The provided adaptive March algorithm is capable of adaptively reorganizing algorithms with different complexities, such that dynamic adjustments can be executed between time complexities of the algorithm and fault coverage rates to achieve a good balance, and the static fault coverage rates are high, thereby effectively improving dynamic fault coverage rates.

Reconfigurable MBIST method based on adaptive march algorithm

A universal test chiplet for testing a plurality of chiplets to be tested is provided. The universal test chiplet includes a chiplet test control circuit module, a test data distribution circuit module, a memory test configuration circuit module, and a chiplet test interface circuit module. The chiplet test control circuit module is configured to provide test data and configure test modes for the chiplets to be tested. The test data distribution circuit module is configured to distribute the test data required by each of the chiplets to be tested from a test data bus. The memory test configuration circuit module is configured to provide test circuits for memories of the chiplets to be tested and automatically generate a test vector. The chiplet test interface circuit module is configured to transmit the test data to the chiplets to be tested in any direction through chiplet test interfaces.

Universal test chiplet

A circuit for post-binding testing of a 2.5D chiplet includes an interposer-dedicated TAP controller, an interposer test interface circuit and a chiplet test output control circuit. A chiplet test configuration register and its corresponding instructions are newly added for the interposer-dedicated TAP controller. The interposer test interface circuit uses an output control signal of the chiplet test configuration register to select the opening or closing of a test signal channel between an interposer and a chiplet. The chiplet test output control circuit uses the chiplet test configuration register to output a control signal for control of a test data output of the chiplet on the interposer.

Circuit and method for post-binding testing of 2.5D chiplet

Disclosed is a serial test circuit for controllable Chiplets, which belongs to the technical field of test or measurement of semiconductor devices during manufacturing or processing. The test circuit includes a master control test module, a slave control test module, a clock controlling module and an outputting module. The master control test module is composed of a test access port module, a segment insertion bit module and a test data register module. The test controlling signal is generated by the master control test module, and the test inputting signals of the slave Chiplets are respectively controlled by the slave control test module after receiving the test controlling signal. At the same time, the test controlling signal is inputted to the clock controlling module to obtain the clock signals of the slave Chiplets. The output signal of the test outputting module is determined by the test controlling signal.

Serial test circuit for controllable Chiplets

The present disclosure relates to the field of design for testability of super-large-scale integrated circuits, and discloses a flexible configurable module (FCM) based chiplet test circuit. The core structure of the circuit is located at an interposer. The test circuit includes FCMs, a control signal configuration module and a test state control module, where the FCM adopts a two-way skew-symmetric structure to implement data transmission in the horizontal direction and the vertical direction; the control signal configuration module is connected to control signals of all the FCMs, so as to control the data transmission directions as well as switch on and switch off states of all the FCMs; and the test state control module controls the shift and update operations of data inside the FCMs and the control signal configuration module.

FCM based chiplet test circuit

The present disclosure discloses a method for extracting parasitic capacitance of interconnection lines of an integrated circuit based on discontinuous Galerkin finite element method. The method includes: dividing non-uniform rectangular grids according to the distribution situation of conductors; determining whether the rectangular grids are boundary cell grids, and marking global numbers and numbers to be solved in sequence; initializing degree of freedom values of all rectangular grids; traversing all rectangular grids, obtaining a linear system of equations, and computing potential function degrees of freedom of all rectangular grids; obtaining an electric field strength function degree of freedom of each cell according to the potential function degree of freedom of each rectangular grid; and dividing a Gaussian surface of each conductor, performing integration of the determined electric field strength function on the Gaussian surface to obtain electric charge, and finally, obtaining main conductor capacitance and coupling capacitance.

Method for extracting parasitic capacitance of interconnection lines of integrated circuit based on discontinuous Galerkin finite element method

An ultra-wideband ground penetrating radar control system, comprising a synchronous clock generating circuit, a GPS positioning module, a measuring wheel encoder module, a digitally controlled delay circuit for equivalent sampling, an analog-to-digital conversion (ADC) circuit, and a main controller. The synchronous clock generating circuit, the GPS positioning module, the measuring wheel encoder module, the digitally controlled delay circuit and the ADC circuit are all connected to the main controller. The synchronous clock generating circuit is further connected to an external ultra-wideband radar transmitter. The digitally controlled delay circuit is further connected to an external sampling pulse generation circuit for equivalent sampling. The ADC circuit is further connected to an external sampling gate for equivalent sampling. The main controller is further connected to an external server via Ethernet. The volume of an ultra-wideband ground penetrating radar control system is reduced. The connecting cables of the system is simplified. The reliability of the ultra-wideband radar system is improved.

Ultra-wideband ground penetrating radar control system

A method for preventing a differential cryptanalysis attack is provided. The method is implemented by an adaptive scan chain, a control module, and a plaintext analysis module. The plaintext analysis module controls the adaptive scan chain, so that two plaintexts differing in the last bit of only one byte are input through scan chains with different structures. Consequently, the two input plaintexts for which differential cryptanalysis attack technology originally can be used to crack the key are unable to generate outputs that can be used by the differential cryptanalysis attack technology.

Method for preventing differential cryptanalysis attack

A narrow pulse generation circuit used in a sequential equivalent sampling system. The circuit comprises a crystal oscillator, an edge sharpening circuit, an avalanche transistor single-tube amplifying circuit and a shaping network connected in sequence, wherein the edge sharpening circuit is used for carrying out edge sharpening on a square wave signal generated by the crystal oscillator; the avalanche transistor single-tube amplifying circuit is used for carrying out avalanche amplification on the sharpened square wave signal to generate a Gaussian pulse signal to adjust the amplitude of a pulse; and the RC shaping network is used for shaping the Gaussian pulse signal to adjust the pulse width at the bottom of the pulse to form a narrow pulse signal. The narrow pulse circuit has a simple structure and narrow pulse width at the bottom and facilitates increasing a signal-to-noise ratio of a whole sequential sampling system.

Narrow pulse generation circuit used in sequential equivalent sampling system

Growing community of inventors

Jiangsu, China

Yufeng Guo