Micron Optics, Inc.

Yufei Bao

Kevin Hsu

Calvin M Miller

Jeffrey W Miller

David Daugherty

Tom Q Li

Tom Q Y Li

Donald Q Snyder

Stephen K Ferguson

Jeff W Miller

Jeffrey W Miller, Legal Representative

Ion Dimitriu

Thomas Q Y Li

The invention relates to Fabry-Perot interferometers (FFPI) comprising two or more optically coupled tunable all-fiber Fabry-Perot component filters, wherein the Fabry-Perot cavity of the filter is formed within a bare section of optical fiber held within a fiber ferrule. The wavelength transmitted by the interferometer can be tuned thermally or electromechanically for a fiber containing the Fabry-Perot cavity bonded into a groove of a metal substrate. The interferometer can be tuned by changing the length of Fabry-Perot cavity, including by the use of a piezoelectric transducer.

Cascaded fiber fabry-perot filters

Improved fiber Fabry-Perot (FFP) filter configurations are provided in which at least one of the mirror-ended fiber ends forming the FFP has a concave fiber core end. The mirror at that fiber core end is thus concave. The invention provides waferless FFP configurations in which the FFP cavity is an air-gap cavity formed by two highly reflective dielectric mirrors deposited directly on optical fiber ends. The air gap cavity can be tuned using various methods to tune the filter. Use of a concave mirror at the fiber core enables filters with improved performance characteristics: including very wide FSR (&#x3e;12000 GHz), very high finesse (&#x3e;5,000), and high glitch-free dynamic range (GFDR) (&#x3e;40 dB). The invention also provides improved wafer-based FFP fixed and tunable filters that incorporate a concave mirror at a fiber core forming the FFP cavity and a fiber (SMF) waveguide within the cavity.

Waferless fiber Fabry-Perot filters

Swept-wavelength lasers with accurately calibrated wavelength output which can be very rapidly scanned or swept over a selected wavelength band. The invention provides lasers that generate wavelengths in the 1550 nm range that can be swept over about 50 nm. These swept-wavelength lasers are generally useful as accurately calibrated high power light sources. Calibration is achieved by use of a calibrated reference system. Swept-wavelength lasers are particularly useful as components of sensor interrogator systems which determine wavelengths reflected (or transmitted) by Fiber Bragg Gratings (FBG) in sensor arrays. Swept wavelength lasers of this invention are also generally useful for testing of WDM systems, particularly for their applications to current communication systems. the invention provides lasers, interrogator systems and systems for testing WDM components employing the lasers as a calibrated light source. The invention also provides methods for calibrating a swept-wavelength laser using the wavelength reference system provided herein as well as methods for detecting wavelengths in an optical signal or output using the interrogator systems provided herein. The invention further provides methods for testing the performance of WDM components using the testing systems provided herein.

Calibrated swept-wavelength laser and interrogator system for testing wavelength-division multiplexing system

A multi-wavelength reference for use in identifying and measuring wavelengths of radiation from an optical device. The invention provides an interferometer to generate a comb of accurately spaced peaks spanning a selected wavelength range combined with a fiber Bragg grating (FBG) of known Bragg wavelength to generate a peak or notch of known wavelength for use in identifying or marking a peak of the comb. The combination provides an accurate multi-wavelength reference useful in particular with high resolution wavelength scanners, such as tunable FFPI. The invention further provides systems for controlling, and/or compensating for, relative shifts in the wavelengths of the interferometer and the FBG as a function of changing temperature.

Fabry Perot/fiber Bragg grating multi-wavelength reference

The invention provides cascaded Fabry-Perot filters having a plurality of optical fibers within a single F-P cavity. Of particular interest are cascaded FFPs having two, three or four optical fiber paths in the filter. An all-fiber FFP filter has a ferrule assembly having two or more aligned fiber ferrules, each having a plurality of optical fibers bonded into axial bores. Mirrors within the ferrule assembly transverse to the fibers from the F-P cavity. The FP filters can be fixed wavelength or tunable by changing an air gap within the cavity. The invention also provides ferrule holders useful for maintaining alignment of and for tuning the air gap of ferrule assemblies. The holders are particularly useful for construction of cascaded F-P filters.

Cascaded fixed and tunable multiple-fiber Fabry Perot filters and fixed and tunable ferrule alignment fixtures for fiber Fabry Perot filters

Fabry-perot fiber bragg grating multi-wavelength reference

A multi-wavelength reference for use in identifying and measuring wave-lengths of radiation from an optical device. The invention provides an interferometer to generate a comb of accurately spaced peaks spanning a selected wavelength range combined with a fiber Bragg grating (FBG) of known Bragg wavelength to generate a peak or notch of known wavelength for use in identifying or marking a peak of the comb. The combination provides an accurate multi-wavelength reference useful in particular with high resolution wavelength scanners, such as tunable FFPI. The invention further provides systems for controlling, and/or compensating for, relative shifts in the wavelengths of the interferometer and the FBG as a function of changing temperature.

A reference system for an optical wavelength scanner, used for measuring wavelengths of radiation from an optical device. The system utilizes a wavelength reference comprising a fixed fiber Fabry-Perot (FFP) filter in combination with a reference fiber Bragg grating (FBG) of accurately known wavelength to minimize the effects of drift and nonlinearities in the scanner. The system utilizes dual optical branches, one containing a device or devices which generate, emit or reflect light of a particular wavelength which is to be measured or identified and the other containing the reference. The two branches are periodically illuminated, while the wavelength band is scanned for peaks or notches in light intensity in the illuminated branch. The wavelengths, at which peaks or notches in the light intensity of each branch occur, are logged. The wavelengths of the reference comb of the fixed FFP are determined by reference to that of the reference FBG. Then, the peaks or notches in the light intensity from the device under test are located by interpolation with respect to the comb of peaks produced by the reference.

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Norcross, GA, United States of America

Yufei Bao