Ningbo Xingwei Cutting-tools Technology Co., Ltd.

Other

Ningbo Galaxy Materials Technology Co. Ltd.

Yuewei Wu

Xiao-dong Xiang

Xiao-ping Wang

Utility knife

Safety cutter utility knife

The invention discloses a apparatus and a method for rapid measurement of heat capacity of a thin film material. Specifically, the apparatus comprises a control device, a clock synchronizer, a flat peak laser device, a rapid thermometer and a heat capacity output device; the control device and the clock synchronizer are signally connected, and the clock synchronizer is signally connected to the flat peak laser device and the rapid thermometer; In the working state, the control device sends a start signal to the clock synchronizer, and the flat peak laser device and the fast thermometer coordinately cooperate; the flat peak laser device irradiates a laser with a spatially flat peak to the surface of the sample; At the same time, the rapid thermometer captures the surface temperature of the sample at a certain point in time during the heating process of the sample, and inputs the measured data into the heat capacity output device to obtain the desired heat capacity parameter. The device of the invention has simple structure, high efficiency and accuracy, and can provide reliable parameter data for the current thermal property setting of various ultra-thin semiconductor films.

Method and apparatus for rapid measurement of heat capacity of a thin film material

The invention discloses a method and a apparatus for rapid measurement of thermal conductivity of a thin film material. The apparatus comprises a control device, a clock synchronizer, a laser, a rapid thermometer and a thermal conductivity output device; the control device and the clock synchronizer are signally connected, and the clock synchronizer is simultaneously signally connected with the laser and the rapid thermometer; in the working state, the control device sends a start signal to the clock synchronizer, and the laser and the rapid thermometer coordinately cooperate, and the laser emits laser light to the surface of the sample; at the same time, the rapid thermometer captures the surface temperature of the sample at the same specified position at different time points during the heating of the sample, and inputs the measured data into the thermal conductivity output device to obtain the thermal conductivity parameter. The apparatus of the invention has simple structure. The method of the invention is efficient and accurate. It can provide reliable parameter data for the thermal properties of various current ultra-thin semiconductor films.

Method and apparatus for rapid measurement of thermal conductivity of a thin film material

A cutting device with an auto-retractable blade, having a housing containing an active blade extendable from a front aperture thereof and a spare blade box therein. An actuator is provided being fixed to an actuator seat contained in and slidable with respect to the housing. The actuator seat has a side protrusion having a front dent defined therein. A blade seat is slidably contained in the housing. The blade seat has an upper fulcrum, a side protrusion, a side blocker, a blade installation plate, a lower fulcrum, and a blade seat return spring. The side protrusion has a front slope and a back tip which is receivable in the front dent of the actuator seat.

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Ningbo, China

Yuewei Wu