Psemi Corporation

Yucheng Tong

Khushali Shah

Parvez Daruwalla

Ping Wing Lai

Jonathan James Klaren

Circuits and methods for generating a bypass pulse to an RF circuit that increases the response time of the circuit to mode changes. Embodiments include a pulse generation circuit that it is self-initiated and self-terminated, generating a bypass pulse as a function of voltages Vand Valong a signal path. Voltage V, a scaled version of V, is compared to a voltage Vderived from Vand a pulse is output while V>V. The pulse temporarily lowers the signal path impedance, reducing the RC time constant of the signal path and allowing fast charging of components coupled to the signal path. The pulse may be used with any other circuit that needs a faster settling time after a mode change but is slowed down by an RC time constant. Usage also extends to providing for rapid discharge of the signal path by adding additional logic components.

Dynamic fast charge pulse generator for an RF circuit

Multi-way signal switch designs and methods for reducing parasitic capacitance. In a first embodiment, two or more series-coupled FET shunt-switches are coupled to at least one switch cell through-switch. At least one shunt-switch is set to an OFF state during normal operation so as to function as a capacitor, while at least one other shunt-switch is set to behave like a capacitor in a switch cell ON state, and is set to behave like a resistor in a switch cell OFF state. In a second embodiment, the combination of at least one FET shunt-switch coupled in series with a capacitor functions as a shunt connection for the signal path, wherein the FET shunt-switch is set to behave like a capacitor when the switch cell is in an ON state, and is set to behave like a resistor when the switch cell is in an OFF state.

Signal switch with reduced parasitic capacitance

Circuits and methods for improving IC yield during automated test equipment (ATE) calibration of circuit designs which require Icalibration and use a closed feedback bias circuit, such as amplifier circuits. The circuit designs include bias branch/active circuit architectures where the active circuit includes one or more active devices. An example first embodiment uses an on-chip calibration switch between the on-chip grounds of a bias network and an active circuit comprising an amplifier. During calibration of the active circuit by the ATE, the calibration switch is closed, and after completion of calibration, the calibration switch is opened. An example second embodiment utilizes an active on-chip feedback loop calibration circuit to equalize voltages between the on-chip grounds of a bias network and an active circuit comprising an amplifier during calibration of the active circuit. Both embodiments mitigate or overcome miscalibration of active circuit current settings resulting from ATE test probe resistance.

Integrated circuit yield improvement

Circuits and methods for generating a bypass pulse to an RF circuit that increases the response time of the circuit to mode changes. Embodiments include a pulse generation circuit that it is self-initiated and self-terminated, generating a bypass pulse as a function of voltages Vand Valong a signal path. Voltage V, a scaled version of V, is compared to a voltage Vderived from Vand a pulse is output while V&#x3e;V. The pulse temporarily lowers the signal path impedance, reducing the RC time constant of the signal path and allowing fast charging of components coupled to the signal path. The pulse may be used with any other circuit that needs a faster settling time after a mode change but is slowed down by an RC time constant. Usage also extends to providing for rapid discharge of the signal path by adding additional logic components.

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San Diego, CA, United States of America

Yucheng Tong