Wuhan Joule Yacht Science & Technology Co., Ltd.

Yuanbing Wang

Xiangshui Miao

Hao Tong

Yingrui Cai

Yang Zhou

Lingjun Zhou

Kaizhan Wang

A method and device for testing the thermal conductivity of a nanoscale material. The method comprises the following steps: preparing or placing a nanoscale materialto be tested on a substrate and plating an electrodeat both ends thereof; determining a resistance temperature coefficient R' of the nanoscale materialto be tested and a resistance Rat the ambient temperature T; generating a small signal voltage Vwith a frequency being 3&#x3c9; on the nanoscale materialto be tested; and measuring the small signal voltage V, and in conjunction with each piece of test data, calculating, according to a formula, the thermal conductivity &#x3ba; of the nanoscale material to be testedat the ambient temperature T.

Method and device for testing thermal conductivity of nanoscale material

The disclosure provides a method for measuring the transverse thermal conductivity of a thin film. The method comprises the steps of measuring the longitudinal thermal conductivity of a thin film to be measured by using a 3&#x3c9; method and by taking a second metal strip deposited on the surface of the thin film to be measured as a heating source at first; measuring the temperature rise of the thin film to be measured in the longitudinal direction by using the 3&#x3c9; method, and deducing the thermal power of the thin film to be measured in the longitudinal direction; and finally, calculating the transverse thermal conductivity of the thin film to be measured. By adopting a 'substrate/thin film to be measured/metal strip' sample structure, the process difficulty of preparing a suspension structure sample can be effectively avoided.

Method and device for measuring transverse thermal conductivity of thin film

Growing community of inventors

Hubei, China

Yuanbing Wang