Honeywell International Inc.

Saint-gobain Glass France

Grace Semicoductor Manufacturing Corporation

Yuan Zheng

Yue Liu

Linan Zhao

Zhi Zheng

Wei Jun Wang

Zhenhong Sun

Leon Xu

Xiaofeng Lin

Julian Chang

Jean-Philippe Schweitzer

Jia Zhu

Dazhi Chen

Meng Yu Pan

An optical device and a method for detecting a flaw of a transparent substrate. A first detection unit is configured to detect the substrate at a predetermined low resolution, where the first detection unit includes a first photosensitive element and a first lens between the substrate and the first photosensitive element, and the first photosensitive element and the first lens are disposed such that an object plane is inclined relative to the substrate; a second detection unit configured to detect the substrate at a predetermined high resolution, where the second detection unit includes a second photosensitive element and a second lens between the substrate and the second photosensitive element; and a processor configured to determine a portion of the flaws detected by the first detection unit as flaws to be detected by the second detection unit, and to determine a type of flaw for the substrate imaged.

Optical device for detecting an internal flaw of a transparent substrate and method for the same

A method and a system for detecting defects of a transparent substrate are provided. The system includes: a plurality of detection channels, each of which includes an illumination component for providing illumination to the substrate and an imaging component for scanning the substrate to provide image of the substrate; a transport module, for producing relative motion between the substrate and the illumination components and the imaging components included in the plurality of detection channels; and a controlling module, for controlling the illumination components and the imaging components included in the plurality of detection channels so that at least two illumination components of the illumination components included in the plurality of detection channels provide illumination to the substrate alternately, and the imaging component included in any of the plurality of detection channels scans the substrate when the illumination component included in that detection channel illuminates the substrate, wherein the imaging components included in at least two detection channels of the plurality of detections channels are the same imaging component. The method and system described by the present invention is capable of discriminating real defects from fake defects which enables substrate to be inspected with free of cleaning.

Method and system for detecting defects of transparent substrate

A microarray reader () comprises a light source (), beam shaping elements () positioned near the light source (), a moving stage () supporting one or more of the light source () and beam shaping elements (), an optical substrate () supporting an immobilized microarray, a reaction chamber () in contact with the optical substrate () and encapsulating buffer solution, a heating/cooling component () in contact with the reaction chamber (), a synchronization circuit, an optical filter () and an imaging sensor () positioned near the optical filter ().

Microarray reader based on evanescent wave detection and method of reading a microarray

A solar cell including a quantum dot, an electron conductor, and a rigid bridge molecule disposed between the quantum dot and the electron conductor. The rigid bridge molecule may include a first anchor group that bonds to the quantum dot and a second anchor group that bonds to the electron conductor. The solar cell may include a hole conductor that is configured to reduce the quantum dot once the quantum dot absorbs a photon and ejects an electron through the rigid bridge molecule and into the electron conductor.

Quantum dot solar cell with rigid bridge molecule

A sense amplifier for Mask Read Only Memory comprising a multiplexer, a plurality of comparators, a plurality of first selected transistors, and a plurality of second selected transistors. The gates of both first selected transistor and second selected transistor are connected to a word line select. One doping area of the first selected transistor is connected to the multiplexer for generating a plurality of signals, and another doping area is connected to a selected bit line. One doping area of each of the second selected transistor is connected to each of the comparators, and another doping area is connected to an external voltage. A cell voltage status is determined when each of the signals and one of doping areas of the second selected transistors are connected to each of the comparators.

Sense amplifier for mask read only memory

Growing community of inventors

Shanghai, China

Yuan Zheng