Chroma Ate Inc.

Other

Yu-Yen Wang

Kuo-Wei Huang

Szu-Yuan Weng

Shou-Mei Lin

Shih-Yao Pan

Bor-Jen Wu

Tsung-Hsien Ou

Chia-Bin Tsen

Jia-Hong Lin

Herein disclosed is an optoelectronic unit measuring device comprising an objective lens, an imaging lens, a photographing lens, and a focus adjustment module disposed in a first light path. The objective lens receives a first testing light and converts the first testing into a second testing light. The imaging lens receives the second testing light and converts the second testing light into a third testing light. The photographing lens receives the third testing light and measures beam characteristic. The focus adjustment module selectively provides a first light transmitting member in the first light path, and adjusts the third testing light to focus at a first focus position or a second focus position. Wherein the focus adjustment module comprises a first carrier plate having a first area with the first light transmitting member, and moves the first carrier plate to selectively align the first area with the first light path.

Optoelectronic unit measuring device

Herein disclosed is an optoelectronic measuring device. The optoelectronic measuring device comprises an objective lens, an imaging lens, a camera, and an optical path adjusting module which are disposed at the first light path. The objective lens receives a first testing light, and transforms the first testing light into a second testing light. The imaging lens receives the second testing light, and transforms the second testing light into a third testing light. The camera measures a beam characteristic of the third testing light. The optical path adjusting module, disposed between the imaging lens and the camera, comprises a mirror, the mirror moves relatively to the imaging lens according to a test command, and adjusts the distance between the imaging lens and the camera at the first light path to be a first optical distance or a second optical distance. Wherein the mirror reflects the third testing light vertically.

Optoelectronic measuring device

A separate microscopy system, applied to observe a specimen positioned on a stage and further to image the specimen on an imaging device, includes an ocular-lens unit, an adjustment unit and an objective-lens unit. The ocular-lens unit has an ocular-lens optical axis, and is manipulated to make the ocular-lens optical axis perpendicular to the stage. The adjustment unit is assembled to a side of the ocular-lens unit close to the stage. The objective-lens unit has an objective-lens optical axis, and is assembled to a side of the adjustment unit close to the stage. The objective-lens unit is manipulated to be adjusted by the adjustment unit to make the ocular-lens optical axis, the objective-lens optical axis and the imaging device co-axially and perpendicular to the stage, such that the specimen can be imaged at an imaging center position of the imaging device. In addition, an adjusting method thereof is also provided.

Separate microscopy system and adjusting method thereof

An optical system includes a collimated light source, a beam splitter, two mirrors and two lenses, a focus lens, and a detector. An initial light beam is generated by the light source and then separated by the beam splitter into a first light beam and a second light beam. The two mirrors respectively direct the first and second light beams on a sample with symmetrical paths and the two lenses focus the first and second light beam on the sample respectively. The first and second light beams are reflected from the sample and along the counterpart paths to the beam splitter. An interfered light beam is then generated by combining the reflected first and second light beams, and focused by a focus lens on a detector. A Dove prism can be configured between one mirror and one lens of the two for contrast enhancement. It can produce the photon combination with same of direction in this setup to enhance contrast.

Optical measurement system

A probe pin alignment apparatus includes a beam-splitting element, an image-sensing device and a light-reflecting element. The beam-splitting element has a first illuminating surface facing a probe element, a second illuminating surface facing an object, and a light incident surface. The beam-splitting element has a semi-reflective surface for reflecting a light beam from the light incident surface to the probe element. The image-sensing device is disposed externally to the light incident surface of the beam-splitting element. The light-reflecting element, disposed oppositely to the light incident surface, allows a light beam to pass through the semi-reflective surface to be reflected back to the semi-reflective surface to be further projected onto the object. The beam-splitting element outputs a probe image and an object image from the first and second illuminating surfaces through the light incident surface. The image-sensing device is to capture the probe image and the object image for performing alignment.

Probe pin alignment apparatus

A brushless DC motor includes opposed pairs of axial magnetic field type permanent-magnets. Two opposed stators are axially arranged at two opposite sides of a rotor, each and stator includes a plurality of equiangularly spaced electromagnetic zones and in least one winding at each electromagnetic zone. A control system is provided to detect phase angle and the revolving speed of the rotor through a sensor and to control the connection of DC current to each winding and its direction, enabling the windings in the electromagnetic zones to form with the rotor at least one motor. By means of detecting speed change of the rotor through the sensor, the control system controls the opposed pairs of axial magnetic field type permanent-magnet brushless DC motor to operate under different motor operation combinations and to output different torques.

Brushless DC motor having opposed pairs of axial magnetic field type

A double-sided, non-iron core, brushless, axial magnetic field permanent-magnet type DC motor includes a shaft, two electromagnet units parallelly mounted on the shaft, and a permanent magnet unit mounted on the shaft between the electromagnet units and having its direction of magnetization disposed in parallel to the shaft. The permanent magnet unit is allowed to rotate relatively around the electromagnet units by being forced by magnetic repulsion force from both sides. Electromagnetic areas at the electromagnet units are arranged in a staggered manner, enabling permanent steel magnets at the permanent magnet unit to be alternatively fully induced from its two opposite sides to provide a high torsion output. The electromagnetic areas of the two electromagnet units are caused to change the phase alternatively at a 90.degree. phase difference, so that vibration and dead section problems are eliminated during the operation of the DC motor.

Growing community of inventors

Tao-Yuan Hsien, Taiwan

Yu-Yen Wang