Marvell International Limited

Hewlett-packard Development Company, L.p.

Yu-Yao Chang

Michael Madden

Gregory Burd

Zining Wu

Xueshi Yang

Panu Chaichanavong

Heng Tang

Tong Zhang

Ramin Samadani

Jun Gao

Ullas Gargi

Simon Widdowson

System and methods are provided for signal processing. For example, an input signal is received at a finite impulse response filter circuit including a plurality of stages, where each stage of the plurality of stages is associated with a sample value of the input signal and a stage weight. An output signal is generated using the finite impulse response filter circuit, the output signal being equal to a weighted sum of the sample values of the input signal. An error signal is generated to indicate a difference between the output signal and a target. A constraint is applied to one or more of the stage weights. The stage weights are changed within the constraint to reduce a magnitude of the error signal.

Systems and methods for finite impulse response adaptation for gain and phase control

Systems and methods are provided for evaluating an asymmetry metric. A receiver receives a synchronization signal, a filtered signal, and a reference signal. A processor processes the synchronization signal and the reference signal to obtain a peak indicator signal, identifies a first set of values and a second set of values from the filtered signal based at least in part on the peak indicator signal, and evaluates an asymmetry metric from the first set of values and the second set of values.

Systems and methods for asymmetry detection based on a synchronization mark

A system including a first filter module configured to receive an input signal including (i) a first shift in a DC level of the input signal and (ii) a second shift in the DC level of the input signal. The first shift has (i) a first magnitude and (ii) a first duration. The second shift has (i) a second magnitude and (ii) a second duration. The second magnitude is different than the first magnitude. The second duration is greater than the first duration. The first filter module is configured to pass the first shift. The second filter module is configured to detect one or more of (i) the first shift and (ii) the second shift, and in response to detecting one or more of (i) the first shift and (ii) the second shift, filter one or more of (i) the first shift and (ii) the second shift.

System and method for detecting and correcting shift in a DC level of an input signal

Methods, systems and computer program products for performing hybrid defect detection are disclosed. In some implementations, an apparatus includes a signal module to process data signals corresponding to data on a storage medium to generate signal samples. The apparatus includes a first defect detector to identify a first portion of the signal samples, determine a number of the signal samples in the first portion that are associated with abnormal signal characteristics, and generate a first output based on the number of the signal samples in the first portion that are associated with abnormal signal characteristics. The apparatus includes a second defect detector to identify a second portion of the signal samples different from the first portion, and generate a second output based on a correlation between data bits and signal samples in the second portion.

Hybrid defect detection for recording channels

A system including a first filter module and a second filter module. The first filter module is configured to (i) pass a first DC shift in an input signal and (ii) convert a second DC shift in the input signal to a first component and a second component. The first DC shift is shorter in duration than the second DC shift. The second filter module is configured to detect one or more of (i) the first DC shift and (ii) the first component and the second component of the second DC shift. In response to detecting one or more of (i) the first DC shift and (ii) the first component and the second component of the second DC shift, the second filter module is configured to filter one or more of (i) the first DC shift and (ii) the first component and the second component of the second DC shift.

DC shift detection and correction

An apparatus includes: a signal module to process data signals corresponding to data on a storage medium to generate signal samples; a defect detector to receive the signal samples, apply a set of parameters to the signal samples, and generate an output based on a count of signal samples that are associated with abnormal signal quality, the signal samples that are associated with abnormal signal quality being included in a portion of the signal samples determined in accordance with the set of parameters; and circuitry to receive the output from the defect detector and identify one or more media defects based on the output.

Methods, systems and computer program products for performing hybrid defect detection are disclosed. A hybrid defect detection mechanism may be used to detect various classes of defects (e.g., long and shallow defects, and short and deep defects) while reducing the probability of a miss or false alarm. In some implementations, the hybrid defect detection mechanism may utilize defect detectors to each receive signal samples and apply a different set of parameters indicating a different respective window to the signal samples. Each defect detector may generate a corresponding output based on a count of signal samples within the corresponding window that are associated with abnormal signal quality.

Methods, systems and computer program products for performing hybrid defect detection are disclosed. A hybrid defect detection mechanism may be used to detect various classes of defects (e.g., long and shallow defects, and short and deep defects) while reducing the probability of a miss or false alarm. In some implementations, the hybrid defect detection mechanism may utilize a defect detector that includes one or more defect sub-detectors. Each defect sub-detector may be associated with an individual threshold and sliding window length to enhance the hybrid defect detection process that maximizes the detection of a specific type or class of defects.

Various method and system embodiments of the present invention are directed to computational estimation of a tempo for a digitally encoded musical selection. In certain embodiments of the present invention, described below, a short portion of a musical selection is analyzed to determine the tempo of the musical selection. The digitally encoded musical selection sample is computationally transformed to produce a power spectrum corresponding to the sample, in turn transformed to produce a two-dimensional strength-of-onset matrix. The two-dimensional strength-of-onset matrix is then transformed into a set of strength-of-onset/time functions for each of a corresponding set of frequency bands. The strength-of-onset/time functions are then analyzed to find a most reliable onset interval that is transformed into an estimated tempo returned by the analysis.

Computational music-tempo estimation

The present invention provides a method of and system for browsing of music. In an embodiment, a method of browsing recorded music comprises steps of: selecting a song from a library; playing at least a portion of the selected song for a user; while the portion of the selected song is playing, accepting input from the user, the input comprising an indication of the user's enjoyment of the at least a portion of the selected song; repeating said steps of selecting, playing and accepting to generate a sequence of song portions; and creating a record comprising an identification of each selected song portions and the indication for the song portions.

Growing community of inventors

Sunnyvale, CA, United States of America

Yu-Yao Chang