Verkada Inc.

Yu Yang

Han Cao

Hanhong Gao

A first set of values reported by an electronic device and not reported by another electronic device over a first period of time that is prior to a firmware release to the electronic device is received. The first set of values is associated with a metric. A set of statistical properties associated with the first set of values is determined. A second set of values reported by the electronic device and not reported by another electronic device over a second period of time that is after the firmware release is received. The second set of values is associated with the metric. A set of statistical properties associated with the second set of values is determined. The set of statistical properties associated with the first set of values and the set of statistical properties associated with the second set of values is compared to detect an anomaly.

Growing community of inventors

Palo Alto, CA, United States of America

Yu Yang