Industrial Technology Research Institute

Yu-Tai Li

Cho-Fan Hsieh

Teng-Chun Wu

Kao-Chi Lin

Chia-Jen Lin

Hung-Sen Wu

Chin Lien

Wei-Yu Lin

Yi-Wei Lin

Cheng-Yu Peng

Yu-Hsien Lee

Chen-Wei Chen

Wei-You Lin

Ching-Chiao Tsai

Li-Chieh Yu

San-Yu Ting

Wei-Lun Yang

Kuan-Wu Lu

Hsien-Chen Ma

A terahertz wave detection chip includes a substrate and at least one detection structure. The detection structure is disposed on a surface of the substrate. The detection structure includes a metamaterial layer and a hydrophilic layer, and the hydrophilic layer is disposed on the metamaterial layer.

Terahertz wave detection chip and terahertz wave detection system

A microfluidic sensor chip includes a body comprising a substrate and an upper cover, and the upper cover having at least one opening, at least one microfluidic channel formed on the substrate and has a supporting surface, wherein the at least one microfluidic channel communicates with the at least one opening, and a metamaterial layer coated on the supporting surface, wherein the metamaterial layer has a plurality of regions, and each region has a corresponding resonance pattern. The present disclosure further provides a measuring system for microfluidic sensor chip includes a carrying board, a plurality of the microfluidic sensor chips, a transmitter emitting a terahertz wave corresponding to the resonance pattern of one of the microfluidic sensor chips, a receiver receiving a reflected wave corresponding to the terahertz wave, and a processor receiving the reflected wave from the processor, and determining a testing sample characteristic according to the reflected wave.

Microfluidic sensor chip and measuring system thereof

A measuring method includes the following. An image to be tested of an object to be tested with a first characteristic pattern is formed and is copied to form multiple images to be tested. The multiple images to be tested are superimposed to form a to-be-tested overlapped image which has the multiple first characteristic patterns. A reference image of a reference object with a second characteristic pattern is formed and is copied to form multiple reference images. The multiple reference images are superimposed to form a reference overlapped image which has the multiple second characteristic patterns. The to-be-tested overlapped image and the reference overlapped image are superimposed to generate a virtual moir&#xe9; image having a moir&#xe9; pattern different from the multiple first characteristic patterns and the multiple second characteristic patterns.

Measuring method

The disclosure provides a calibration assembly for a scan device. The calibration assembly includes a plurality of light-permeable plates and a reflection plate. The light-permeable plates are different in size, and the light-permeable plates are arranged along thicknesses directions thereof to form a step shape. The light-permeable plates define a plurality of light-permeable areas that respectively have different numbers of layers of the light-permeable plates inversely proportional to transmittances of the light-permeable areas. The light-permeable areas are configured to be permeable to a light having a predetermined frequency. The reflection plate is disposed at a side of one of the light-permeable plates in the thickness direction thereof. The reflection plate has a plurality of first holes having different sizes, and the reflection plate is configured to block the light having the predetermined frequency. The disclosure also provides a calibration system having the calibration assembly.

Calibration assembly for scan device and calibration system

A gas measurement device is provided and includes a gas channel module and a sensor component disposed within the gas channel module. The sensor component includes a substrate, a porous membrane, and a metal layer disposed between the substrate and the porous membrane. A gas measurement method is also provided.

Gas measurement device and gas measurement method

A solar cell testing system including a lower electrode, a solar cell, an encapsulation material, a sodium-containing template, an upper electrode, a voltage source and a measuring circuit is provided. The solar cell is disposed on the lower electrode. The encapsulation material is disposed on the solar cell. The sodium-containing template is disposed on the encapsulation material, wherein the sodium-containing template has a sodium ion content ranging between 9-39%. The upper electrode is disposed on the sodium-containing template. The voltage source is connected between the upper electrode and the lower electrode. The measuring circuit is connected between the solar cell and the lower electrode for measuring a shunt resistance of the solar cell.

Solar cell testing system and testing method thereof

A material aging test apparatus and method thereof are provided. The aging apparatus includes a pulsed laser, a beam expansion assembly, a platform, and a spectrum analyzer. The pulsed laser is used for transmitting a first beam. The beam expansion assembly is used for converting the first beam into a second beam and projecting the second beam onto an object. The platform is used for carrying the object. The spectrum analyzer is used for measuring the spectral response which is generated from the object by the projection of the second beam.

Material aging test apparatus and method thereof

An aging apparatus including a pulse laser, a beam expansion assembly, and a platform configured to carry an object is provided. The pulse laser transmits a first beam to the beam expansion assembly. The beam expansion assembly expands the first beam to a second beam and projects the second beam onto the object.

Growing community of inventors

Taichung, Taiwan

Yu-Tai Li