Phison Electronics Corporation

Yu-Siang Yang

Wei Hung Lin

An-Cheng Liu

Yu-Cheng Hsu

Szu-Wei Chen

Yu-Heng Liu

Shih-Jia Zeng

Hsiao-Yi Lin

Chun-Hsi Lai

Ting-Chien Zhan

Kuo-Hsin Lai

Yu-Hsiang Lin

Shao-Wei Yen

Lih Yuarn Ou

Tsai-Hao Kuo

Yao-Hsuan Li

A data accessing method, a memory controlling circuit unit, and a memory storage device are provided. The method includes: reading a codeword stored in a physical programming unit, and calculating a bit change ratio of a bit value change in dummy data included in the codeword; adjusting a read voltage level or a log likelihood ratio according to the bit change ratio; and performing a decoding operation on the codeword by using the adjusted read voltage level or the adjusted log likelihood ratio.

Method for adjusting a read voltage level or log likelihood ratio of a memory based on a calculated bit change ratio, memory controlling circuit unit, and memory storage device

A memory management method, a memory storage apparatus and a memory control circuit unit are disclosed. The method includes: sending a plurality of read command sequences including a first read command sequence and a second read command sequence, and the first read command sequence is configured to instruct a performing of a first read operation on a first physical unit of a rewritable non-volatile memory module, and the second read command sequence is configured to instruct a performing of a second read operation on the first physical unit; determining a system parameter according to a time interval between a first read time point corresponding to the first read operation and a second read time point corresponding to the second read operation; and instructing the rewritable non-volatile memory module to perform a specific operation according to the system parameter.

Memory management method, memory storage apparatus and memory control circuit unit

A data reading method, a memory storage device, and a memory control circuit unit are disclosed. The method includes: receiving a read command from a host system, and the read command instructs reading data from at least one logical unit, and the logical unit is mapped to a first physical unit; obtaining state information of at least two neighboring memory cells in the first physical unit; determining an electrical parameter offset value corresponding to the neighboring memory cells according to the state information; and sending a read command sequence according to the electrical parameter offset value, and the read command sequence instructs reading the first physical unit based on at least one electrical parameter, and the electrical parameter is controlled by the electrical parameter offset value.

Data reading method, memory storage device, and memory control circuit unit

A memory management method, a memory storage device, and a memory control circuit unit are provided. The method includes: reading first data from a first physical unit by using a first read voltage level according to first management information among multiple candidate management information; decoding the first data and recording first error bit information of the first data; and adjusting sorting information related to the candidate management information according to the first error bit information. The sorting information reflects a usage order of the candidate management information in a decoding operation.

Memory management method, memory storage device, and memory control circuit unit

A memory control method, a memory storage device and a memory control circuit unit are provided. The method includes: determining a retry threshold value according to decoding history information which includes information related to at least one first decoding operation previously performed; and determining whether to enter a second decoding mode according to the retry threshold value after at least one second decoding operation performed based on a first decoding mode is failed. A decoding ability of the second decoding mode is higher than a decoding ability of the first decoding mode.

Memory control method, memory storage device and memory control circuit unit

A memory control method, a memory storage device, and a memory control circuit unit are provided. The memory control method includes: programming multiple first memory cells in a first physical erasing unit in a rewritable non-volatile memory module; and applying an electronic pulse to at least one word line in the rewritable non-volatile memory module. The at least one word line is coupled to multiple second memory cells in the first physical erasing unit. The second memory cells include the first memory cells. The electronic pulse is not configured to read, program, or erase the second memory cells.

Memory control method, memory storage device, and memory control circuit unit

A data protection method, a memory storage device and a memory control circuit unit are provided. The method includes: setting a plurality of disk array tags corresponding to a plurality of word lines and a plurality of memory planes, and the plurality of disk array tags corresponding to one of the word lines connected to one of the memory planes are at least partially identical to the plurality of disk array tags corresponding to another one of the word lines connected to another one of the memory planes; receiving a write command and data corresponding to the write command from a host system; and sequentially writing the data into the plurality of word lines and the plurality of memory planes corresponding to the plurality of disk array tags.

Data protection method, with disk array tags, memory storage device and memory control circuit unit

A memory control method, a memory storage device and a memory control circuit unit are provided. The method includes: reading a first physical unit among a plurality of physical units based on a first electrical configuration to obtain first soft information; reading the first physical unit based on a second electrical configuration which is different from the first electrical configuration to obtain second soft information; classifying a plurality of memory cells in the first physical unit according to the first soft information and the second soft information; and decoding data read from the first physical unit according to a classification result of the memory cells.

A flash memory control method, a flash memory storage device and a flash memory controller are provided. The method includes the following. A flash memory module is instructed to perform a data merge operation to copy first data in a first physical unit into at least one second physical unit. After the first data is copied and before the first physical unit is erased, another programming operation is performed on the first physical unit to change a data storage state of at least a part of memory cells in the first physical unit from a first state into a second state. After the first physical unit is programmed, an erase operation is performed on the first physical unit.

Flash memory control method of re-programming memory cells before erase operations, flash memory storage device and flash memory controller

A memory control method for a rewritable non-volatile memory module is provided according to an exemplary embodiment of the disclosure. The method includes: sending a first read command sequence which indicates a reading of a first physical unit by using a first read voltage level to obtain first data; decoding the first data; sending a second read command sequence which indicates a reading of the first physical unit by using a second read voltage level to obtain second data; decoding the second data with assistance information to improve a decoding success rate of the second data if the second read voltage level meets a first condition or the second data meets a second condition; and decoding the second data without the assistance information if the second read voltage level does not meet the first condition and the second data does not meet the second condition.

A memory control method for a rewritable non-volatile memory module is provided according to an exemplary embodiment of the disclosure. The method includes: reading a first physical unit based on a first read voltage level to obtain first data; reading the first physical unit based on a second read voltage level to obtain second data; reading the first physical unit based on a third read voltage level to obtain third data; obtaining a first reference value which reflects a data variation status between the first data and the second data; obtaining a second reference value which reflects a data variation status between the first data and the third data; reading the first physical unit based on a fourth read voltage level to obtain fourth data according to the first reference value and the second reference value; and decoding the fourth data by a decoding circuit.

Adjusting read voltage level in rewritable nonvolatile memory module

A voltage identifying method, a memory controlling circuit unit, and a memory storage device are provided. The method includes: reading a plurality of first memory cells according to a first read voltage group in a plurality of read voltage groups and performing a first decoding operation to generate first verification information; identifying a plurality of second read voltage groups in the plurality of read voltage groups corresponding to a first interval in a plurality of intervals according to the first interval in which the first verification information is located; and reading the plurality of first memory cells by using a third read voltage group in the plurality of second read voltage groups and performing the first decoding operation.

Voltage identifying method, memory controlling circuit unit and memory storage device

A memory control method for a rewritable non-volatile memory module including a plurality of physical units is provided according to an exemplary embodiment of the disclosure. The method includes: reading first data from a first physical unit of a rewritable non-volatile memory module; decoding the first data by a decoding circuit; updating reliability information according to the decoded first data; reading second data from a second physical unit of the rewritable non-volatile memory module; and decoding the second data by the decoding circuit according to the updated reliability information.

A memory management method for a memory storage device including a rewritable non-volatile memory module is provided according to an exemplary embodiment of the disclosure. The method includes: programming first data into a plurality of first memory cells in the rewritable non-volatile memory module, such that the programmed first memory cells have a plurality of states; sending a first single-stage read command sequence which indicates to read the programmed first memory cells by using a first read voltage level; obtaining first count information corresponding to the first read voltage level according to a read result corresponding to the first single-stage read command sequence; and adjusting the first read voltage level according to the first count information and default count information corresponding to the first read voltage level.

Memory management method, memory storage device and memory control circuit unit

A memory control method for a rewritable non-volatile memory module is provided according to an exemplary embodiment of the disclosure. The method includes: reading first data from a first memory cell of the rewritable non-volatile memory module by a first read voltage level; decoding the first data by a decoding circuit; reading second data from the first memory cell by a second read voltage level; obtaining reliability information according to a first data status of the first data and a second data status of the second data, and the first data status and the second data status reflect that a first bit value of the first data is different from a second bit value of the second data; and decoding the second data by the decoding circuit according to the reliability information.

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Taipei, Taiwan

Yu-Siang Yang