Amtran Technology Co., Ltd.

Yu-Ruei Li

Chin-Kun Huang

Peng-Ta Chiu

Kao-Min Lin

A resonant testing system for testing a device under test, including a processing circuit, a microphone array and a camera is disclosed. The processing circuit generates a scanning frequency signal and transmits the scanning frequency signal to the device under test, which plays sound based on the scanning frequency signal. The microphone array includes several microphones, each of the microphones receives the sound played by the device under test, and the microphone array outputs several audio signals corresponding to the microphones. The camera captures a real time image signal of the device under test, and transmits the real time image signal to the processing circuit. The processing circuit computes resonant positions and resonant levels according to the audio signals, and combines the resonant positions, the resonant levels and the real time image signal to generate a real time resonant result. A resonance testing method is disclosed.

Resonant testing system and resonant testing method

An automatic test method for testing functions of a device under test is disclosed. The automatic test method includes the following operations. A sample video is generated based on first sample photos and at least one second sample photo by a processor. The sample video is displayed by the device under test and test photos are generated based on the content of the displayed sample video captured by a camera. The first sample photos are compared with the test photos to generate a display compared result. A display error message or a display pass message is generated based on the display compared result by the processor, configured to indicate that whether a display function of the device under test is dysfunctional.

Automatic test method

An automatic test device is disclosed. The automatic test device is includes connection ports, a processor, and a transmission integrated interface. The connection ports is configured to couple to a device under test. The processor is coupled to the connection ports and is configured to transmit a test instruction through the connection ports to the device under test. The device under test is in a test mode after receiving the test instruction, and the first processor is configured to receive a test signal transmitted through the connection ports from the device under test when the device under test is in the test mode. The transmission integrated interface is coupled between the connection ports and the processor, and is configured to transmit at least one of the test instructions to the connection ports or the processor. An automatic test system is also disclosed herein.

Automatic test system and device thereof

A robot includes a sensing circuit, a driving circuit, and a processor. The sensing circuit includes a first sensor and a second sensor. The first sensor is configured to receive a first sensing signal and the second sensor is configured to receive a second sensing signal. The driving circuit is configured to control an operation of a roller circuit and to control a forward direction of the roller circuit. The processor is coupled to the sensing circuit and the driving circuit. When the processor determines that, according to the first sensing signal and the second sensing signal, a sensing target is a bridge, the processor controls the roller circuit through the driving circuit to adjust the forward direction, such that the robot gets across the bridge.

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Taipei, Taiwan

Yu-Ruei Li