Taiwan Semiconductor Manufacturing Comp. Ltd.

Global Unichip Corporation

Yu-Lun Wan

Ting-Yu Chen

Bor-Yueh Liu

A testing circuit is provided. The testing circuit includes a clock cone, a series of shift register chains, and a control circuit. The clock cone is divided into a plurality of fan-out partitions operated in the same clock domain. The shift register chains are configured to shift out one-hot signals on demand and each shift register chain includes multiple registers with the same amount as fan-out partitions. The control circuit receives the one-hot signals from the shift register chains and enables the divided fan-out partitions therefore.

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Hsinchu, Taiwan

Yu-Lun Wan