Beijing Boe Optoelectronics Technology Co., Ltd.

Boe Technology Group Co., Ltd.

Arcserve (usa) LLC

Yu Lu

Chuanqi Sun

Jia Qi Li

Tingze Dong

Dongsheng Huang

Yupeng Chen

Haoran Gao

Zhinan Zhang

Jingang Hao

Xing Qin

Hua Liu

Zhao Chen

Huibo Zhang

Qingzeng Shan

A system and method are presented that reduce the use of snapshot space. One embodiment of the present invention only performs snapshot copies for blocks on the source volume that have not yet been backed up. Another embodiment stores the data in the snapshot space in multiple files, and then deletes those files that contain data whose corresponding blocks have been backed up. A third embodiment stores the data in the snapshot space directly onto a dedicated device and then reuses the data blocks for data already backed up when the dedicated device is full.

Snapshot space reduction method and apparatus

A display substrate () is provided for a display device. The display substrate () includes a display region with an alignment film formed on one side of the display region. A non-display region at a peripheral area of the substrate and adjacent to the display region. An uneven layer () formed on the non-display region at a same side as the alignment film. A first film layer () formed on the uneven layer () and covering the uneven layer () to form a substantially flat surface of the non-display region with respect to the display region.

Display-panel substrate, fabrication method, and display apparatus

A display substrate and a display device including the display substrate are provided. The display substrate includes an alignment mark in an alignment region of the display substrate; and a blocking structure in a preset region around the alignment mark, wherein the blocking structure is arranged to block residual particles carried by a rubbing roller during rubbing.

Display substrate and display device

A detecting device for preventing a substrate from being scratched by an apparatus and a detecting method using the same is provided. The device comprises a detecting substrate, a controlling module, a transmitting module and a monitoring module. The controlling module detects a position information of a contact point between the apparatus and the detecting substrate and transmits the position information to the transmitting module. The transmitting module transmits the position information received from the controlling module to the monitoring module. The monitoring module determines the coordinates of the contact point between the apparatus and the detecting substrate according to the position information. The detecting substrate can be employed to simulate the substrate used in the real manufacture process of the TFT-LCD so that the apparatus in each step can be detected before the real manufacture process is performed. Thus, the apparatus can be adjusted before the real manufacture process is performed, and therefore the substrate can be effectively prevented from being scratched by the apparatuses in the real manufacture process.

Detecting device and detecting method

The present invention relates to a substrate with a substrate test circuit. In an embodiment, by making the length of the wiring from a first data-line-test input terminal to a first panel equal to that of the wiring from a second data-line-test input terminal to the first panel, the input resistances between two test input terminals of a first data-line-test line and the first panel are identical, and thus when a data line of the first panel is detected, the voltage drops of test signals inputted from the two test input terminals are the same, and the test signals actually loaded to the first panel are the same and the detecting abilities are identical.

Substrate with test circuit

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Beijing, China

Yu Lu