Honda Motor Co., Ltd.

Panasonic Intellectual Property Management Co., Ltd.

Yu Kurokawa

Yasuhiro Okuno

Yousuke N Irie

Hirotsugu Inoue

Takuya Niioka

Daiki Kurei

Shunsuke Torigai

Shogo Tokunaga

Ryusei Homma

Yu Tanabe

Disclosed are a see-through image display system and method. The see-through image display system includes: an image capturing device for photographer, configured to capture a photographer; a plurality of image capturing devices for object to be captured, configured to capture a target object to be captured; a viewing angle detection portion, configured to detect a viewing angle of the photographer according to an image of the photographer captured by the image capturing device for photographer; an image connection portion, configured to connect an overlapping portion of the images of object to be captured that are captured by the image capturing devices for object to be captured, so as to connect the images; an image generating portion, configured to perform homograph transformation on the images of object to be captured that are connected by the image connection portion based on the viewing angle of the photographer to generate a see-through image.

See-through image display system and method

Method for measuring a depth of a defect inside an inspection object is provided. The method comprises steps of: generating thermal image data corresponding to a temperature of a surface of the inspection object by photographing a heated surface of the inspection object at a predetermined time interval by a photographing device; obtaining a temperature curve showing a temporal change in temperature of the surface of the inspection object based on the thermal image data; fitting a theoretical equation obtained from a heat conduction equation including a parameter related to the depth of the defect of the inspection object to the temperature curve to obtain a theoretical curve showing a temporal change in temperature of the surface of the inspection object; and obtaining the depth of the defect of the inspection object based on a value of the parameter in the theoretical equation corresponding to the theoretical curve.

Thickness measurement method, thickness measurement device, defect detection method, and defect detection device

Growing community of inventors

Tokyo, Japan

Yu Kurokawa