Visera Technologies Company Limited

Omnivision Technologies, Inc.

Yu-Kun Hsiao

Wu-Cheng Kuo

Chung-Hao Lin

Zong-Ru Tu

Kuo-Feng Lin

Chin-Chuan Hsieh

Han-Lin Wu

Sheng-Feng Lu

Yueh-Ching Cheng

Li-Kai Lee

Wei-Ko Wang

Fu-Tien Weng

Chi-Han Lin

Chieh-Yuan Cheng

Huang-Jen Chen

Hsin-Wei Mao

Chung-Jung Hsu

Chih-Kung Chang

An image sensor includes a sensing layer, a number of filter units, and a grid structure. The filter units are disposed on the sensing layer. The grid structure is disposed on the sensing layer and surrounding each of the filter units. The grid structure includes a first partition wall disposed on the sensing layer and located between two adjacent filter units, and a second partition wall disposed on the first partition wall located between the two adjacent filter units. The refractive index of the first partition wall is less than the refractive index of the second partition wall.

Image sensor

An image-sensor structure is provided. The image-sensor structure includes a substrate with a plurality of photoelectric conversion units formed therein, a plurality of color filters formed above the substrate, wherein the color filters are divided into red color filters, green color filters and blue color filters, a plurality of microlenses correspondingly formed above the color filters, a transparent material layer formed above the microlenses, a first filter blocking infrared (IR) light formed above the transparent material layer, a second filter allowing transmission of visible light formed above the first filter, and a lens module formed above the second filter.

Image-sensor structures

A double-lens structure and a method for fabricating the same are provided. The double-lens structure includes a first lens structure formed of a color filter layer having a first refractive index and a second lens structure formed of a micro-lens material layer having a second refractive index and disposed on the first lens structure. The first refractive index of the color filter layer is different from the second refractive index of the micro-lens material layer. An incident light enters the second lens structure and then passes through the first lens structure. Further, a method for fabricating the double-lens structure is also provided.

Methods for farbricating double-lens structures

An image-sensing device includes a semiconductor substrate, a passive layer, and a light-collecting element. The semiconductor substrate includes a photo-sensing element, and the passive layer is disposed over the semiconductor substrate. The light-collecting element is disposed over the passive layer, and includes first, second and third loops. The first loop has a first width. The second loop surrounds the first loop and has a second width that is less than the first width. The third loop surrounds the first and second loops, and has a third width that is less than the second width. The light-collecting element aligns with the photo-sensing element, and the first, second, and third loops include different refractive indices.

Image-sensing device

An image sensor includes a sensing layer, a transparent plate, and a first guided-mode resonance structure. The sensing layer includes sensing units configured to sense a light beam. The transparent plate is located above the sensing layer. The first guided-mode resonance structure is disposed on a first area of the transparent plate, and blocks a first waveband of the light beam from passing through.

Image sensor and image capture device

The present invention provides an image sensor, including: a sensor array layer formed of a plurality of normal sensor units and a plurality of spectrometer sensor units; a first guided mode resonance (GMR) structure having a first grating pitch and disposed on the sensor array layer to cover N (where N is an integer) of the spectrometer sensor units; a second GMR structure having a second grating pitch and disposed on the sensor array layer to cover N of the spectrometer sensor units; and a plurality of color filter units disposed on the sensor array layer to cover the normal sensor units.

An image sensor includes a sensing layer, filter units, and a grid structure. The filter units are disposed on the sensing layer. The grid structure is disposed on the filter units, and includes grating portions. The grating portions form a number of grating groups, and each of the grating groups is separated from each other.

An image sensing device includes: an active layer with a plurality of photo-sensing elements; a color pattern disposed over one of the photo-sensing elements, wherein the color pattern has a color selected from the group consisting of red (R), green (G), and blue (B); a microlens disposed on the color pattern; and a transmissive pattern being adjacent to the color pattern and over another one of the photo-sensing elements, wherein the transmissive pattern includes a color filter portion and a microlens portion, and an absolute value of a difference of refractive indexes between the microlens and the color pattern is less than 0.3, and there is no difference of refractive indexes between the microlens portion and the color filter portion of the transmissive pattern.

Image sensing device and method for fabricating the same

An image-sensor structure is provided. The image-sensor structure includes a substrate, a plurality of photoelectric conversion units formed in the substrate, and a plurality of color filter patterns including a red filter pattern having a first refractive index, a green filter pattern having a second refractive index and a blue filter pattern having a third refractive index formed above the substrate and the photoelectric conversion units, wherein at least one color filter pattern contains a component having a specific refractive index such that the second refractive index of the green filter pattern is higher than the first refractive index of the red filter pattern and the third refractive index of the blue filter pattern.

A color correction device for an image sensor is provided. The image sensor is divided into regions. The color correction device includes a quantum efficiency (QE) measurement circuit, an addressing circuit, and a correction circuit. The QE measurement circuit generates a color signal according to a sensing signal from each pixel of the image sensor. The addressing circuit receives the color signal corresponding to each pixel, obtains a location of each pixel on the image sensor, and averages all of the color signals corresponding to the pixels whose locations are disposed in one of the regions to obtain an average color signal. The correction circuit receives the average color signal to obtain a color correction matrix of the one of the regions and corrects the color signals of the pixels whose locations are in the one of the regions by the color correction matrix.

Color correction devices and methods

Double-lens structures and fabrication methods thereof

A solid-state imaging device is provided. The solid-state imaging device includes a semiconductor substrate containing a plurality of image sensors. A color filter including a plurality of color filter segments is disposed above the semiconductor substrate. Each of the color filter segments corresponds to one of the image sensors. Further, a plurality of partitions is disposed between the color filter segments. Each of the partitions is disposed between any two adjacent color filter segments. The partition has a height smaller than the height of the color filter segment, wherein the height of the partition is based on the bottom of the color filter segment to the top of the partition, and the height of the color filter segment is based on the bottom of the color filter segment to the top of the color filter segment.

Solid-state imaging devices

Solid-state imaging devices and fabrication methods thereof are provided. The solid-state imaging device includes a substrate containing a first photoelectric conversion element and a second photoelectric conversion element. A color filter layer has a first color filter component and a second color filter component respectively disposed above the first and second photoelectric conversion elements. A light-shielding partition is disposed between the first and second color filter components. The light-shielding partition has a height lower than that of the first and second color filter components. A buffer layer is disposed between the first and second color filter components and above the light-shielding partition. The buffer layer has a refractive index lower than that of the color filter layer.

Solid-state imaging devices and methods of fabricating the same

An imaging apparatus includes a filter, a first image sensor and a second image sensor. The filter transmits a first light in a range of wavelengths and reflects a reflected light out of the range of wavelengths. An incident light is split to the first light and the reflected light. The first image sensor receives the first light to generate a first image signal. The second image sensor receives the reflected light to generate a second image signal.

Imaging capture apparatus having plurality of image sensors generating respective image signals based on emitted light areas

An image sensing device includes: a semiconductor substrate with a photo-sensing element; a passive layer disposed over the semiconductor substrate, having a first refractive index; a color pattern disposed over the passive layer, wherein the color pattern aligns to the photo-sensing element and has a color selected from the group consisting of red (R), green (G), blue (B), and white (W), and a second refractive index; and an electromagnetic wave guiding element disposed in at least one of the color pattern and the passive layer, having a third refractive index, and the third refractive index is greater than the first refractive index or the second refractive index, and a first difference between the third refractive index and the first refractive index is at least 0.2, and a second difference between the third refractive index and the second refractive index is at least 0.2.

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Hsin-Chu, Taiwan

Yu-Kun Hsiao