Phison Electronics Corporation

Yu-Cheng Hsu

Wei Hung Lin

Yu-Siang Yang

Szu-Wei Chen

An-Cheng Liu

Kuo-Yi Cheng

Siu-Tung Lam

Tien-Ching Wang

Po-Cheng Su

Shih-Jia Zeng

Kuo-Hsin Lai

Hsiao-Yi Lin

Yu-Hsiang Lin

Tsai-Hao Kuo

Po-Hao Chen

Chih-Kang Yeh

Chun-Yen Chang

Shao-Wei Yen

Li-Chun Liang

Chih-Wei Wang

Kiang-Giap Lau

Lih Yuarn Ou

Chi-Heng Yang

Tzung-Lin Wu

Hoe-Hong Lim

Chun Teng Cheng

Jia-Fan Chien

A method of writing data, including: obtaining a write instruction; writing a first data of write data to a target physical unit in a target word line of a plurality of word lines in accordance with the write instruction; after writing the first data, when the target word line has one or more empty physical units arranged after the target physical unit, selecting one or more further target physical unit respectively located in one or more further target word lines; and writing second data connected after the first data in the write data to the selected further target physical units, wherein the one or more further target word lines are arranged after the target word line.

Data writing methods, memory storage device and memory control circuit unit

A data accessing method, a memory controlling circuit unit, and a memory storage device are provided. The method includes: reading a codeword stored in a physical programming unit, and calculating a bit change ratio of a bit value change in dummy data included in the codeword; adjusting a read voltage level or a log likelihood ratio according to the bit change ratio; and performing a decoding operation on the codeword by using the adjusted read voltage level or the adjusted log likelihood ratio.

Method for adjusting a read voltage level or log likelihood ratio of a memory based on a calculated bit change ratio, memory controlling circuit unit, and memory storage device

A voltage calibration method, a memory storage device, and a memory control circuit unit are disclosed. The method includes: reading first data from a first physical unit using a first read voltage level and reading second data from at least one second physical unit using a second read voltage level; obtaining count information reflecting a total number of memory cells meeting a default condition in the first physical unit and the at least one second physical unit according to the first data and the second data; and calibrating the first read voltage level according to the count information.

Voltage calibration method, memory storage device and memory control circuit unit

A voltage prediction method, a memory storage device and a memory control circuit unit are disclosed. The method includes: reading a plurality of memory cells in a rewritable non-volatile memory module by using a first read voltage level to obtain count information, and the first read voltage level is configured to distinguish a first state and a second state adjacent to each other in a threshold voltage distribution of the memory cells, and the count information reflects a total number of first memory cells meeting a target condition among the memory cells; and predicting a second read voltage level according to the count information, and the second read voltage level is configured to distinguish a third state and a fourth state adjacent to each other in the threshold voltage distribution.

Voltage prediction method, memory storage device and memory control circuit unit

A decoding method, a memory storage device, and a memory control circuit unit are disclosed. The method includes: sending at least one read command sequence instructing to read a first physical unit in a rewritable non-volatile memory module; receiving response data from the rewritable non-volatile memory module, wherein the response data includes a plurality of identification bits, and the plurality of identification bits reflect a voltage variation of a first bit line where a first memory cell in the first physical unit is located during a discharge process; determining a decoding parameter corresponding to the first memory cell according to the plurality of identification bits; and decoding data read from the first memory cell according to the decoding parameter.

Decoding method, memory storage device and memory control circuit unit

A memory control method, a memory storage device, and a memory control circuit unit are provided. The memory control method includes: receiving a read command from a host system; in response to a first physical erasing unit being a first type physical unit, sending a first operation command sequence to instruct a rewritable non-volatile memory module to read a first physical programming unit based on a first electronic configuration; and in response to the first physical erasing unit being a second type physical unit, sending a second operation command sequence to instruct the rewritable non-volatile memory module to read the first physical programming unit based on a second electronic configuration. The first electronic configuration is different from the second electronic configuration.

Memory control method, memory storage device, and memory control circuit unit

A memory management method, a memory storage device, and a memory control circuit unit are provided. The method includes: reading first data from a first physical unit by using a first read voltage level according to first management information among multiple candidate management information; decoding the first data and recording first error bit information of the first data; and adjusting sorting information related to the candidate management information according to the first error bit information. The sorting information reflects a usage order of the candidate management information in a decoding operation.

Memory management method, memory storage device, and memory control circuit unit

A data protection method, a memory storage device and a memory control circuit unit are provided. The method includes: setting a plurality of disk array tags corresponding to a plurality of word lines and a plurality of memory planes, and the plurality of disk array tags corresponding to one of the word lines connected to one of the memory planes are at least partially identical to the plurality of disk array tags corresponding to another one of the word lines connected to another one of the memory planes; receiving a write command and data corresponding to the write command from a host system; and sequentially writing the data into the plurality of word lines and the plurality of memory planes corresponding to the plurality of disk array tags.

Data protection method, with disk array tags, memory storage device and memory control circuit unit

A memory control method, a memory storage device and a memory control circuit unit are provided. The method includes: reading a first physical unit among a plurality of physical units based on a first electrical configuration to obtain first soft information; reading the first physical unit based on a second electrical configuration which is different from the first electrical configuration to obtain second soft information; classifying a plurality of memory cells in the first physical unit according to the first soft information and the second soft information; and decoding data read from the first physical unit according to a classification result of the memory cells.

Memory control method, memory storage device and memory control circuit unit

A memory control method for a rewritable non-volatile memory module is provided according to an exemplary embodiment of the disclosure. The method includes: sending a first read command sequence which indicates a reading of a first physical unit by using a first read voltage level to obtain first data; decoding the first data; sending a second read command sequence which indicates a reading of the first physical unit by using a second read voltage level to obtain second data; decoding the second data with assistance information to improve a decoding success rate of the second data if the second read voltage level meets a first condition or the second data meets a second condition; and decoding the second data without the assistance information if the second read voltage level does not meet the first condition and the second data does not meet the second condition.

A data writing method, a memory controlling circuit unit and a memory storage device are provided. The method includes: receiving a plurality of data; writing the plurality of data into a first physical erasing unit by using a multi-page programming mode; and writing at least one first data of the plurality of data into a second physical erasing unit by using a single-page programming mode; verifying the plurality of data stored in the first physical erasing unit; and if the verification fails, performing a writing operation to a third physical erasing unit by using the multi-page programming mode according to the at least one first data and the plurality of data.

Data writing method with verifying a part of data, memory controlling circuit unit and memory storage device

A memory control method for a rewritable non-volatile memory module including a plurality of physical units is provided according to an exemplary embodiment of the disclosure. The method includes: reading first data from a first physical unit of a rewritable non-volatile memory module; decoding the first data by a decoding circuit; updating reliability information according to the decoded first data; reading second data from a second physical unit of the rewritable non-volatile memory module; and decoding the second data by the decoding circuit according to the updated reliability information.

A decoding method, a memory controlling circuit unit, and a memory storage device are provided. The method includes: reading a first physical programming unit by using a first read voltage to obtain first data; determining whether a first ratio of a first quantity of a first bit value and a second quantity of a second bit value in the first data is greater than a threshold; when the first ratio is not greater than the threshold, performing a decoding operation according to the first data to generate first decoded data and outputting the first decoded data; and when the first ratio is greater than the threshold, not performing the decoding operation according to the first data.

Decoding method, memory controlling circuit unit and memory storage device

A memory control method for a rewritable non-volatile memory module is provided according to an exemplary embodiment of the disclosure. The method includes: reading first data from a first memory cell of the rewritable non-volatile memory module by a first read voltage level; decoding the first data by a decoding circuit; reading second data from the first memory cell by a second read voltage level; obtaining reliability information according to a first data status of the first data and a second data status of the second data, and the first data status and the second data status reflect that a first bit value of the first data is different from a second bit value of the second data; and decoding the second data by the decoding circuit according to the reliability information.

A voltage adjusting method, a memory controlling circuit unit and a memory storage device are provided. The method includes: reading a first physical programming unit in a first physical programming unit group to obtain first data; correcting the first data according to a first error check and correction code corresponding to the first data to obtain first corrected data; reading a second physical programming unit in the first physical programming unit group to obtain second data; and adjusting a first read voltage for reading a first memory cell to a second read voltage according to the first data, the first corrected data, and the second data.

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Yilan County, Taiwan

Yu-Cheng Hsu