Samsung Electronics Co., Ltd.

Younsik Park

Hyojin Choi

Changwook Jeong

In Huh

Seungju Kim

Taehwan Kim

Jun Haeng Lee

Yongwoo Lee

Hyeongtae Kim

Youngmin Oh

Jeonghoon Ko

Jaecheol Lee

Hyun Sun Park

Hyungjung Seo

Jaewon Ko

Hyeonsik Son

Joonwan Chai

A system for verifying an integrated circuit includes a tracing module configured to: trace a specified path based on the specified path on which a timing analysis will be performed among a plurality of signal transfer paths within the integrated circuit and a netlist of the integrated circuit at a transistor level, generate a list of nets listing names of nets in the specified path based on the netlist and information on the specified path, declare design constraints for the specified path based on the list of the nets, and generate parasitic data for the net based on the list of the nets. The system further includes an analysis module configured to perform a timing analysis for the specified path based on the design constraints and the parasitic data.

Methods and systems for verifying integrated circuits

A system verification method includes generating a first verification vector as a result of a first action of an agent, the first verification vector referring to an observation corresponding to at least one state already covered, from among states of elements of a target system, identifying a first coverage corresponding to at least one state covered by the first verification vector, from among the states of the elements, updating the observation by reflecting the first coverage in the observation, and generating a second verification vector through a second action of the agent, the second verification vector referring to the updated observation.

Method and apparatus with system verification based on reinforcement learning

An electronic device configured to generate a verification vector for verifying a semiconductor circuit including a first circuit block and a second circuit block includes a duplicate command eliminator configured to receive a first input vector including a plurality of commands and to provide a first converted vector, in which ones of the plurality of commands that generate the same state transition are changed into idle commands, based on a state transition of the first circuit block obtained by performing a simulation operation on the first input vector, a reduced vector generator configured to provide a first reduced vector in which a number of repetitions of the idle commands included in the first converted vector is reduced, and a verification vector generator configured to output the first reduced vector having a coverage that coincides with a target coverage among a plurality of first reduced vectors as a first verification vector.

Electronic devices generating verification vector for verifying semiconductor circuit and methods of operating the same

A memory device including: a memory cell array including a plurality of memory cell rows; an address buffer configured to store addresses of target rows of the plurality of memory cell rows, wherein the addresses of the target rows have been repeatedly accessed; a minimum access output circuit configured to select, when there are a plurality of rows having a same minimum access count among the target rows, any one of the plurality of rows having the same minimum access count as a minimum access row based on a selection command value, and to output an index value of the minimum access row; and a control circuit configured to output a command instructing replacement of an address corresponding to the index value of the minimum access row with an address of an access row and storage of the address of the access row in the address buffer.

Memory device for processing a row-hammer refresh operation and a method of operating thereof

Growing community of inventors

Hwaseong-si, South Korea

Younsik Park