Samsung Electronics Co., Ltd.

Youngkwang Yoo

Youngjin Cho

Jeongho Lee

Han-Ju Lee

Youngsik Kim

Younggeun Lee

Seungyou Baek

Eunchu Oh

Jaegeun Park

Sungyong Seo

Yena Lee

Kui-Yon Mun

JinHyeok Choi

Kwangjin Lee

Hee Hyun Nam

Jaeho Shin

JeongHo Lee

Biwoong Chung

A memory controller for controlling a memory operation of a memory device includes: an error correction code (ECC) circuit configured to detect an error of first read data read from the memory device and correct the error; an error type detection logic configured to write first write data to the memory device, compare second read data with the first write data, detect an error bit of the second read data based on a result of the comparing, and output information about an error type identified by the error bit; and a data patterning logic configured to change a bit pattern of input data to reduce an error of the second read data based on the information about the error type.

Memory controller, memory system including the same, and method of operating the memory controller

Disclosed is a method of performing, at a controller, an access to a memory device, which includes transmitting, at the controller, a first command signal, a first address signal, and a first swizzling signal to the memory device, selecting first data bits stored in a memory cell array of the memory device based on the first command signal and the first address signal, and sequentially outputting, at the memory device, at least a part of the first data bits to the controller in a burst manner, based on the first swizzling signal.

Semiconductor memory device and operation method of swizzling data

An operating method of a memory device, which includes a first memory region and a second memory region, includes reading first data from the first memory region and storing the read first data in a data buffer block, performing a first XOR operation on the first data provided from the data buffer block and second data read from the second memory region to generate first result data, writing the first data stored in the data buffer block in the second memory region, performing a second XOR operation on the first data and the first result data to generate the second data, storing the generated second data in the data buffer block, and writing the second data stored in the data buffer block in the first memory region.

Memory device for swapping data and operating method thereof

A storage device includes random access memories, nonvolatile memory devices, a controller configured to control the nonvolatile memory devices, and a driver circuit configured to receive a command and an address from an external device, output a buffer command according to the command and the address, and transmit the command and the address to one of a first channel connected to the random access devices and a second channel connected to the controller according to the command and the address. The storage device further includes a plurality of data buffers configured to communicate with the external device and electrically connect the external device to one of a third channel connected to the random access memory devices and a fourth channel connected to the controller in response to the buffer command. Each of the data buffers includes a FIFO (first-in first-out) circuit.

Storage device including random access memory devices and nonvolatile memory devices

A storage device includes a data buffer, a device controller, and nonvolatile memories. The data buffer is configured to transact data from an external device. The device controller is configured to receive a command and an address from an external device, to control the data buffers, and to transact data with the data buffers. The nonvolatile memories are configured to perform write, read, and erase operations under control of the device controller. When a first link training between an external device and the data buffers is performed by the external device, the device controller performs a second link training between the device controller and a data buffer internally without control of the external device.

Storage device and operating method of storage device

The nonvolatile memory module includes at least one nonvolatile memory device and a device controller configured to receive a storage command from an external device and to perform an operation corresponding to the received storage command. The device controller includes a random access memory (RAM). After completing the corresponding operation, the device controller stores status information in the RAM and then transmits an alert signal to the external device.

Nonvolatile memory module and operation method thereof

A nonvolatile memory module may include a nonvolatile memory device, a nonvolatile memory controller configured to control the nonvolatile memory device, a volatile memory device configured as a cache memory of the nonvolatile memory device, and a module controller configured to receive a command and an address from an external device, external to the nonvolatile memory module, and to send a volatile memory command and a volatile memory address to the volatile memory device through a first bus and a nonvolatile memory command and a nonvolatile memory address to the controller through a second bus in response to the received command and address. The volatile memory device is configured to load two or more cache data on each of two or more memory data line groups and two or more tags on each of two or more tag data line groups in response to the volatile memory address.

Nonvolatile memory modules comprising volatile memory devices and nonvolatile memory devices

A dynamic random access memory (DRAM) device includes a memory cell array including a plurality of memory cells, a refresh controller configured to perform a plurality of refresh operations on the plurality of memory cells in response to a plurality of refresh commands from an external device, and a refresh counter configured to count a number of the refresh commands for a fixed period of time and compare the counted number with a threshold. The refresh counter is configured to generate a power failure signal to cause the DRAM device to enter a power failure mode in response to the comparison of the counted number with the threshold. The refresh controller is configured to perform a refresh operation on the plurality of memory cells without control of the external device in the power failure mode.

Growing community of inventors

Yongin-si, South Korea

Youngkwang Yoo