Skhynix Inc.

Youngjun Ku

Youngjun Park

Junil Moon

Seokwoo Choi

Byungkuk Yoon

A semiconductor device includes a plurality of first micro-bumps suitable for transferring normal signals; a plurality of a second micro-bumps suitable for transferring test signals; and a test circuit including a plurality of scan cells respectively corresponding to the first and second micro-bumps. The test circuit is suitable for applying signals stored in the respective scan cells to the first and second micro-bumps, feeding back the applied signals from the first and second micro-bumps to the respective scan cells, and sequentially outputting the signals stored in the scan cells to a test output pad.

Semiconductor device having micro-bumps and test method thereof

A memory device including a data pad, and first and second data strobe pads, a data strobe signal generation circuit suitable for generating a read data strobe signal, outputting the read data strobe signal to the first data strobe pad, and generating an internal data strobe signal based on the read data strobe signal, during a test read operation, an input circuit suitable for feeding back and receiving data outputted to the data pad, during the test read operation, an alignment circuit suitable for aligning data received by the input circuit, based on the internal data strobe signal, and a test register circuit suitable for performing a preset operation on the data aligned by the alignment circuit and storing data obtained through the preset operation, wherein the test register circuit outputs the stored data to a read path during the test read operation.

Growing community of inventors

Gyeonggi-do, South Korea

Youngjun Ku