Samsung Sdi Co., Inc.

Youngil Kwon

Taewon Kim

Byoungkuk Kim

Youngseok Song

Inhwan Sul

Jinseo Park

Kiyeon Jo

A system for image analysis and a method thereof are disclosed. In one embodiment, the system includes a detector configured to receive an image of a sample, isolate particles from a background image of the sample image and detect positions of the isolated particles and a first operator configured to calculate a static degree of randomness values of the particles using Lennard-Jones potentials based on the detected positions. The system may further include a second operator configured to obtain a dynamic degree of randomness values of particles based at least in part on the sum of tensile forces between particles by implicit integration added until the particles reach a dynamic equilibrium, and calculate a positional degree of randomness of particles based at least in part on subtraction of the dynamic degree of randomness values from the static degree of randomness values.

Growing community of inventors

Yongin-si, South Korea

Youngil Kwon