Samsung Sds Co., Ltd.

YoungHwan Namkoong

Jaeyoung Lee

Dawoon Kim

JeongHoon Hong

Disclosed are a system and method for processing data. The system for processing data according to an embodiment of the present disclosure includes a determiner configured to receive one or more sets of input data and a set of metadata about a structure of each of the sets of input data and to determine whether the input data is normal data or abnormal data based on the metadata; a first storage configured to store the normal data; a second storage configured to store the abnormal data; and a data processor configured to correct the abnormal data stored in the second storage such that the abnormal data has the same structure as the normal data and store the corrected abnormal data in the first storage.

System and method for processing data

Disclosed are an automated management system and method for fault events of a data center. A fault event monitoring unit is configured to check statuses of servers to detect occurrence of a fault event, and if a fault event occurs, determine whether an automated action is possible. A fault event related action recommending unit is configured to, with respect to a fault event that is newly detected by the fault event monitoring unit or determined to be difficult to be resolved by an action stored in a fault event related action storage unit, search for and extract information related to the fault event determined to be difficult to be resolved from information accumulated in a fault event information knowledge storage unit, and based on the extracted information, generate and output a group of automated action candidates for the fault event determined to be difficult to be resolved. A fault event action unit is configured to automatically take an action against a fault event detected by the fault event monitoring unit by use of the action accumulated in the fault event related action storage.

Growing community of inventors

Seoul, South Korea

YoungHwan Namkoong