Samsung Electronics Co., Ltd.

Seoul National University

Etamax Co., Ltd

Youngbeom Kim

Jongho Lee

Doohee Lee

Huyndon Jung

Sangyoung Zho

Junki Lee

Imperfect RF pulses in a multi-spin-echo (MSE) sequence disturb prediction of relaxation times. Provided are a magnetic resonance imaging (MRI) apparatus and method of operating the same, whereby a characteristic parameter value may be acquired from MR signal data via training using an artificial neural network (ANN) and a parametric map may be generated based on the acquired characteristic parameter value. The ANN may be trained to compensate for imperfect RF pulses while providing reduced computation times to produce an output image.

Magnetic resonance imaging apparatus for generating parametric map from magnetic resonance signal data and method of operating the same

The present disclosure relates to a substrate defect measuring apparatus for detecting defects inside a substrate by photoluminescence and detecting defects outside the substrate by using the scattering of incident light for generating photoluminescence, and provides an apparatus for constituting an optical system in order to measure scattered and/or reflected light together in a procedure of measuring the photoluminescence, thereby shortening a measurement time.

Defect investigation device simultaneously detecting photoluminescence and scattered light

Growing community of inventors

Suwon-si, South Korea

Youngbeom Kim