Samsung Electronics Co., Ltd.

Young-uk Chang

Chang-sik Kim

Seok-Won Hwang

Hyun-Dong Kim

Dong-ryul Ryu

An integrated circuit memory device includes a test pattern data generator circuit that is configured to generate an extended test pattern data based on test pattern data provided to the memory device during a test mode of the memory device and is configured to provide the extended test pattern data and the test pattern data during a test mode of the memory device. Related methods are also disclosed.

Circuits and methods for generating high frequency extended test pattern data from low frequency test pattern data input to an integrated circuit memory device

Growing community of inventors

Kyounggi-do, South Korea

Young-uk Chang