Samsung Electronics Co., Ltd.

Young Tae Jang

Jin Ho Seo

Ji Hun Shin

Young Kyun Jeong

Sung Ho Suh

Se Jun Kim

Moo Sup Lim

Hyung Jin Bae

Seung Ho Shin

Kang Sun Lee

Seog Heon Ham

Hyeok Jong Lee

Se-jun Kim

Byung Jo Kim

Bu Yong Um

Jin Woo Kim

Kyoung Min Koh

Ju Hyun Ko

Jin Young Jeong

Won Joon Hong

Min Woo Son

Kwang June Sohn

A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.

Image sensing device and operating the same

An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.

Image sensor

An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.

Image sensor, data processing system including the same

An image sensor operating in a skip mode and reading out a pixel signal provided by at least one of a plurality of pixels and compensating for fixed pattern noise (FPN) in column-parallel pipelines. The image sensor includes; a switch signal generator that generates a first switch control signal and a second switch control signal in response to FPN location information characterizing a first pipeline among the column-parallel pipelines as a noisy pipeline generating FPN, and characterizing a second pipeline among the column-parallel pipelines as a quiet pipeline not generating FPN, a binning switch block including a first switch controlled by the first switch control signal and a second switch controlled by the second switch control signal, wherein the first switch control signal causes the first pipeline to be inactivated and the second switch control signal causes the second pipeline to be activated, and a binning block that performs a digital binning operation on digital signals provided via the column-parallel pipelines including the second pipeline.

Image sensor and image processing system that compensate for fixed pattern noise (FPN)

In one embodiment, an image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter configured to convert analog pixel signals output from the pixels into digital signals, a first cluster configured to store a first group of digital signals among the digital signals and to output first image data, a second cluster configured to store a second group of digital signals among the digital signals and to output second image data, and at least one cluster switch connected to the first cluster and the second cluster, a first channel, and a second channel. The image sensor is configured to transmit at least one among the first image data and the second image data to at least one among the first channel and the second channel based on an operation mode.

Image sensor for controlling a transmission speed of sensed image data and image processing system including the same

An image sensor includes a pixel array, a column signal processor, and a column mismatch compensator. The pixel array outputs a pixel signal from each column line during a pixel measuring time, and outputs a reference signal during a reference measuring time. The column signal processor performs correlated double sampling (CDS) on the reference signal to generate a reference CDS signal, and performs CDS on the pixel signal to generate a pixel CDS signal. The column mismatch compensator compensates the pixel CDS signal based on the reference CDS signal.

Image sensor for compensating column mismatch and method of processing image using the same

In one embodiment, the boost circuit includes a boost unit configured to perform a charge pumping operation based on a control signal. A controller is configured to control the boost unit such that the boost unit performs a lesser charge pumping operation from an initial time when power is supplied to the boost circuit until a desired time than after the desired time.

Boost circuit capable of controlling inrush current and image sensor using the boost circuit

Growing community of inventors

Pyeongtaek-si, South Korea

Young Tae Jang