Hynix Semiconductor Inc.

Skhynix Inc.

Osong Medical Innovation Foundation, Korea University Research and Business Foundation

Postech Academy-industry Foundation

Shin Poong Pharmaceutical Co., Ltd.

Hynix Semicondustor Inc.

Young Soo Park

Sang Sig Kim

Kyoung Ah Cho

Doo Hyeok Lim

Sol A Woo

Jae Yun Kim

Beom Sik Kim

Se Chun Park

Chae Kyu Jang

Sei Kwang Hahn

Sung Joo Ha

Il Hwan Cho

Seung Ho Chang

Byung Su Kim

Eun Ju Oh

Jin Sun Cho

Yi Jin Kwon

Jun Seok Yeom

Eui Jin Hwang

Jung Kyu Park

Ka Young Cho

Eui Sang Yoon

Moo Seok Seo

The present disclosure relates to a novel integrate-and-fire (IF) neuron circuit using a single-gated feedback field-effect transistor (FBFET) to realize small size and low power consumption. According to the present disclosure, the neuron circuit according to one embodiment may generate potential by charging current input from synapses through a capacitor. In this case, when the generated potential exceeds a threshold value, the neuron circuit may generate and output a spike voltage corresponding to the generated potential using a single-gated feedback field-effect transistor connected to the capacitor. Then, the neuron circuit may reset the generated spike voltage using transistors connected to the feedback field-effect transistor.

Integrate-and-fire neuron circuit using single-gated feedback field-effect transistor

The present disclosure relates to a novel neuron circuit using a p-n-p-n diode to realize small size and low power consumption. The neuron circuit according to one embodiment of the present disclosure may generate potential by charging current input from synapses through a capacitor. In this case, when the generated potential exceeds a critical value, the neuron circuit may generate and output a spike voltage corresponding to the generated potential using a p-n-p-n diode connected to the capacitor.

Neuron circuit using p-n-p-n diode without external bias voltages

The present invention relates to a filler composition for tissue reinforcement, including hyaluronic acid and alkylene diamine crosslinked hydrogel. The filler composition exhibits the positive physical properties required for tissue reinforcement, such as biocompatibility and swelling ability, as well as useful effects in that the same can remain in vivo for a long time.

Filler composition for tissue reinforcement

A method of operating a semiconductor device includes programming one of a drain dummy cell and a source dummy cell which are included in a cell string; and coupling a bit line to the cell string in response to program states of the drain dummy cell and the source dummy cell and a voltage level applied to a drain dummy line coupled to a gate of the drain dummy cell and a source dummy line coupled to a gate of the source dummy cell.

Semiconductor device and operating method thereof

A non-volatile memory apparatus includes a memory cell array, a power supply configured to generate an operation voltage according to an operation mode and provide the memory cell array with the operation voltage, and a controller configured to provide the memory cell array with a first verification voltage and a second verification voltage in a program verification operation, detect a high speed program cell by the first verification voltage and the second verification voltage from selected memory cells to be programmed and set the high speed program cell to be in a program inhibition state, and detect a low speed program cell by the second verification voltage.

Semiconductor memory apparatus and program verification method

A semiconductor memory device is operated by, inter alia: precharging a bit line, providing a first voltage to a coupling circuit for coupling the bit lines and cell strings of a plurality of memory cells, providing a program voltage to a selected word line coupled to a memory cell on which a program operation will be performed among the plurality of memory cells, providing a pass voltage to unselected word lines, providing a second voltage lower than the first voltage to the coupling circuit, discharging the bit line by loading program data, and providing a third voltage lower than the second voltage to the coupling circuit.

Semiconductor memory device and method of operating the same

A semiconductor memory device includes a memory cell array configured to include a plurality of memory blocks, a voltage generator configured to output operating voltages for data input and output to global lines, and a row decoder configured to transfer the operating voltages to local lines of a memory block, selected from among the plurality of memory blocks, and supply a ground voltage to local lines of unselected memory blocks in response to address signals.

Semiconductor memory device

A semiconductor memory device includes: a plurality of memory cells coupled in series between a bit line and a source line; and a bit line control voltage supply unit configured to provide a control voltage to the bit line according to an operation mode, wherein the bit line control voltage supply unit provides a control voltage having a ground voltage level to the bit line during a soft programming operation.

Semiconductor memory device and data erase method thereof

An erase method of a semiconductor device includes performing an operation comprised of supplying an erase pulse to erase the memory cells of a memory block, performing an erase verify operation for detecting memory cells of the memory block having threshold voltages dropped to a target erase voltage, from among the memory cells, performing a pre-program operation on the memory cells having the threshold voltages dropped to the target erase voltage, if, as a result of the erase verify operation, the memory block comprises memory cells having the threshold voltages higher than the target erase voltage and the memory cells having the threshold voltages dropped to the target erase voltage, and repeating the operation of supplying an erase pulse, the erase verify operation, and the pre-program operation until the threshold voltages of all the memory cells drop to the target erase voltage.

Semiconductor device and erase methods thereof

A semiconductor memory device includes a voltage generator configured to supply a program voltage, a sub-verification voltage, or a target verification voltage to memory cells selected during a program operation, page buffers configured to latch first data according to results from comparing threshold voltages of the selected memory cells with the sub-verification voltage and latch second data according to results from comparing the threshold voltages of the memory cells with the target verification voltage, a sub-pass check circuit configured to output a sub-pass signal in response to the first data outputted from the page buffers, a main pass check circuit configured to output a main pass signal in response to the second data outputted from the page buffers, and a control circuit configured to control whether the voltage generator supplies the sub-verification voltage and the target verification voltage in response to the sub-pass signal and the main pass signal.

Semiconductor memory device and method of programming the same

A semiconductor memory device includes memory cell blocks having physical pages coupled to memory cells, peripheral circuits configured to program the memory cells or read data stored in the memory cells, and a controller configured to control the peripheral circuits so that a pre-program is performed to make memory cells in the memory cell blocks have threshold voltages higher than a set voltage by programming memory cells of the selected memory cell block, having threshold voltages lower than the set voltage, in response to an erase command. The set voltage is an intermediate threshold voltage obtained from the threshold voltages of the memory cells of the selected memory cell block.

Semiconductor memory device and method of erasing the same

A method of programming a semiconductor memory device includes a first program step for performing a program by supplying a first program voltage, having a specific amount, to a selected word line of the semiconductor memory device for a set time and a second program step for performing a program by supplying, to the selected word line, a second program voltage which is a step pulse gradually rising from a start voltage lower than the first program voltage.

Various exemplary embodiments of a nonvolatile memory apparatus are disclosed. In one exemplary embodiment, the memory apparatus may include: a page buffer; an even bit line connected to the page buffer; an odd bit line connected to the page buffer; an even memory cell string installed on the even bit line; an odd memory cell string installed on the odd bit line; and a bit line select unit configured to selectively generate a signal read path between the even bit line and the even memory cell string or between the odd bit line and the odd memory cell string.

Nonvolatile memory apparatus capable of reducing current consumption and related driving method

A semiconductor memory device includes a memory string coupled between a common source line and a bit line, a page buffer configured to supply a first precharge voltage to the bit line and to latch data corresponding to a threshold voltage level of a memory cell of the memory string, wherein the data is detected according to a shift in a voltage of the bit line, in a precharge operation, a precharge circuit configured to supply a second precharge voltage to the common source line in the precharge operation, and a voltage supply circuit configured to generate operating voltages for turning on the memory string in the precharge operation. While the first precharge voltage is supplied from the page buffer to the bit line, the second precharge voltage is supplied to the bit line through the memory string.

Semiconductor memory device and method of precharging the same with a first and second precharge voltage simultaneously applied to a bit line

A page buffer circuit comprises a first sensing unit configured to sense a voltage of a bit line and change a voltage of a first sense node, a data conversion unit configured to sense a voltage level of the first sense node and change a voltage level of a second sense node or to couple the second sense node and the first sense node, and first and second latch units coupled in common to the second sense node.

Growing community of inventors

Seoul, South Korea

Young Soo Park