Samsung Electronics Co., Ltd.

Young-so Park

Do-hyung Kim

Joo-young Lee

An integrated circuit device includes a substrate, an insulating layer on the substrate, and a plurality of parallel conductive lines on the insulating layer. An etch barrier is on each of the parallel conductive lines wherein each of the etch barriers comprises a layer of silicon nitride on a respective conductive line and wherein each of the etch barriers further comprises a layer of silicon on the silicon nitride layer. In addition, the device includes a plurality of conductive vias through the insulating layer providing electrical connection to respective surface portions of the substrate, wherein each of the conductive vias is provided in the insulating layer between the etch barriers.

Methods for fabricating integrated circuit devices including etching

A method for fabricating an integrated circuit device includes the steps of forming an insulating layer on a substrate and forming a plurality of parallel conductive lines on the insulating layer. An etch barrier is formed on each of the parallel conductive lines, and contact holes are formed between the etch barriers. The contact holes expose portions of the substrate without exposing the plurality of parallel conductive lines. In particular, the contact holes can be formed by forming a patterned mask layer on the insulating layer and etch barriers, and etching exposed portions of the insulating layer. The patterned mask layer selectively exposes a plurality of parallel strips orthogonal to the plurality of parallel conductive lines. Related structures are also discussed.

Growing community of inventors

Kyungki-do, South Korea

Young-so Park