Samsung Electro-mechanics Co., Ltd.

Young Sik Hur

Jeong Hoon Kim

Dukhyun Kim

Systems and methods may be provided for transmitter calibration. The systems and methods may include providing one or more radio frequency (RF) test signals at an output of a transmitter, wherein the one or more RF test signals are based upon IQ baseband test signals, and applying an envelope detector to the one or more test signals to obtain one or more characteristic signals from the one or more RF test signals, where the one or more characteristic signals includes one or more first harmonic components and one or more second harmonic components associated with the one or more RF test signals. The systems and methods may further include analyzing the one or more second harmonic components to determine one or more IQ mismatch compensation parameters, and analyzing the one or more first harmonic components to determine one or more carrier leakage or DC offset compensation parameters.

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Alpharetta, GA, United States of America

Young Sik Hur