Skhynix Inc.

Young-Sik Heo

Sung-Soo Chi

A semiconductor device includes a first pre-stress block suitable for generating a first load signal, which corresponds to an active signal during an active mode and/or to a high voltage level during a precharge mode, in response to a stress section signal; a first delay amount reflection block suitable for reflecting a first delay amount in the first load signal in response to one or more first delay amount control signals; and a first main stress block suitable for generating a word line driving control signal, which corresponds to the active signal during the active mode and the high voltage level during the precharge mode, in response to the stress section signal and the first load signal.

Semiconductor device

An address detection circuit may include one or more address storage units, an initialization unit suitable for deleting an address stored in an address storage unit having a value greater than N, wherein the value is obtained by dividing a respective total input number that addresses have been inputted after the corresponding address is stored by a respective input number corresponding to the stored address, a detection unit suitable for detecting an address having an input number that is a reference number or more from the addresses stored in the one or more address storage units, and a selection unit suitable for selecting an address storage unit in which an address is not stored and storing an input address in the selected address storage unit.

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Gyeonggi-do, South Korea

Young-Sik Heo