Okins Electronics Co., Ltd.

Benobio Co., Ltd.

Young Shik Park

Hyung Il Jeon

Jin Kook Jun

Myung Gi Seo

Dae Joong Yoon

Young Ryong Yoon

Sung Oog Kim

Udell Gutterman Jordan

In-Hyun Lee

Jae Hyuk Choi

Jae Yeon Lee

An inspecting method using an electro-optical detecting device is disclosed. The electro-optical detecting device includes: an upper substrate and a lower substrate; a nematic liquid crystal layer interposed between the upper substrate and the lower substrate; a transparent electrode interposed between the nematic liquid crystal layer and the upper substrate, the transparent electrode connected to a device under test (DUT) via a power supply; a polarizing plate located over the nematic liquid crystal layer; and a reflecting plate located under the nematic liquid crystal layer. A method using the electro-optical detecting device includes applying a voltage between the transparent electrode and the DUT to generate an electric field across the liquid crystal layer; illuminating the detector and capturing an image of the detector using the light reflected from the detector; and determining the DUT has some defects from the image of the detector by an abnormal electric field generated between the transparent electrode and the DUT.

Inspecting method using an electro optical detector

Growing community of inventors

Icheon-si, South Korea

Young Shik Park