Samsung Electronics Co., Ltd.

Young-ki Kwak

Woon-sup Choi

Chul-woong Jang

Jong-pil Park

Jae-il Lee

Sung-Yeol Kim

In-ho Choi

Ho-sun Yoo

In-su Yang

Seung-ho Jang

A field mounting-type test apparatus and method for enhancing competitiveness of a product by simulating various test conditions including a mounting environment for improving quality reliability of a memory device and by minimizing overall loss due to change in a mounting environment thus reducing testing time and cost. The field mounting-type test apparatus includes a mass storage device configured to store logic data simulating a mounting environment of a device under test (DUT) and a tester main frame configured to test the DUT using the logic data.

Field mounting-type test apparatus and method for testing memory component or module in actual PC environment

An apparatus for testing an object includes a test chamber, a guiding member, testing units and a transferring unit. The test chamber is configured to receive the object. The guiding member is arranged extending along a first direction in the test chamber. The testing units are movably connected to the guiding member to test electrical characteristics of the object. The transferring unit is arranged in the test chamber to load the object into one of the testing units and unload the object from one of the testing units. The testing units may be transferred to a position for repair without suspension of the apparatus. The object may be tested using another testing unit while the other testing unit is being repaired.

Apparatus for testing a semiconductor package

Growing community of inventors

Cheonan-si, South Korea

Young-ki Kwak