Samsung Display Co., Ltd.

Young-Joo Noh

Jongwoo Park

Hyunho Kim

Dae Youn Cho

Youngtae Choi

Ju Hee Lee

Hyojung Kim

Jinwoo Chae

An inspection system for a display cell having a display part and a plurality of data lines connected to first and second pixel units of the display part. An array test part and a lighting test part are located in a peripheral area around the display part. An inspection apparatus is configured to provide the array test part with an array control signal to block an array data signal from being applied to a plurality of data lines in a period in which a white image is displayed and to provide the lighting test part with a lighting control signal to block a lighting data signal from being applied to a plurality of data lines during a period in which a black image is displayed, during a drive reliability test mode for displaying a test image including the black image and the white image.

Inspection system and method of inspecting a display cell using the same

Growing community of inventors

Anyang-si, South Korea

Young-Joo Noh