Koh Young Technology Inc.

Young Joo Hong

Deok Hwa Hong

Min Kyu Kim

Jeong Hun Choi

Seung Tae Kim

Eun Ha Jo

Hong Ki Kim

Guk Bin Lim

A blood flow measurement device according to various embodiments may be configured to irradiate light to a first position of a subject and a second position of the subject located in a first direction with respect to the first position, acquire intensities of the reflected light at the first position and the second position, determine a first value which is a difference between the intensities of the reflected light at the first position and the second position, irradiate light to a third position of the subject located in a second direction with respect to the second position, acquire an intensity of the reflected light at the third position, determine a second value which is a difference between the intensities of the reflected light at the second position and the third position, and determine a blood flow direction based on the first value and the second value.

Blood flow measurement device and blood flow measurement method

The present disclosure relates to a method of correcting a three-dimensional image. To correct an image distorted by coherence gate curvature (CGC) occurring by an optical system, the method generates a three-dimensional image of a sample holder on which an object to be measured is placed from an interference signal, generates a CGC profile on the basis of an image of a cover glass of the sample holder appearing in the three-dimensional image, generates a CGC fitting curve from the CGC profile, and corrects the interference signal by using the CGC fitting curve. The present disclosure also relates to an OCT system capable of performing a method of correcting a three-dimensional image.

OCT system, method of generating OCT image and storage medium

A substrate inspection apparatus is disclosed. The substrate inspection apparatus includes: a first light source configured to radiate an ultraviolet light onto a coated film of a substrate, the coated film being mixed with fluorescent pigments; a first light detector configured to capture fluorescence generated from the coated film onto which the ultraviolet light is radiated, and to obtain a two-dimensional (2D) image of the substrate; a processor configured to derive one region among a plurality of regions of the substrate based on the 2D image; a second light source configured to radiate a laser light onto the one region; and a second light detector configured to obtain optical interference data generated from the one region by the laser light, wherein the processor is configured to derive a thickness of the coated film of the one region based on the optical interference data.

Apparatus for inspecting substrate and method thereof

A substrate inspection apparatus is disclosed. The substrate inspection apparatus according to the present disclosure may include: a light source configured to radiate laser light onto a coated film that is spread on a region of a substrate; a light detector configured to obtain optical interference data on an interference between reference light, that is generated by the laser light being reflected from a surface of the coated film, and measurement light, that is generated by the laser light penetrating the coated film and being scattered; and a processor configured to derive a thickness of the coated film corresponding to the region, based on the optical interference data.

Growing community of inventors

Gwangmyeong-si, South Korea

Young Joo Hong