Skhynix Inc.

Young Hyun Baek

Geun Ho Choi

Soo Bin Lim

Bo Yeun Kim

Sang Hee Kim

Ji Eun Jang

A shift register generates a synthesized pulse having a different pulse width according to which one of a first phase pulse and a second phase pulse is inputted, generates an internal shifted synthesized pulse and a shifted synthesized pulse from the synthesized pulse, and generates a detection signal by detecting a pulse width of the internal shifted synthesized pulse. The shift register outputs the shifted synthesized pulse as one of a first shifted phase pulse and a second shifted phase pulse based on the detection signal.

Shift register and electronic device including the same

A repair circuit may be provided. The repair circuit may include a latch array including a plurality of latch sets. The repair circuit may include a fuse array including a plurality of fuse sets, and configured to be written, in each fuse set, with repair address data and latch address data which defines a position of a latch set where the repair address data is to be stored, among the plurality of latch sets. The repair circuit may include a first decoder configured to cause data written in any one fuse set among the plurality of fuse sets to be outputted, and a second decoder configured to cause the repair address data to be stored in the latch set corresponding to the latch address data among the plurality of latch sets.

Repair circuit, semiconductor apparatus and semiconductor system using the same

A semiconductor device and or method of repairing the semiconductor device may be provided. The semiconductor device may include an error information storage circuit. The error information storage circuit may be configured to latch an address to generate a latched fail address and a rupture control signal.

Semiconductor devices and methods relating to the repairing of the same

A semiconductor system and semiconductor device may be provided. The semiconductor system may include a first semiconductor device configured to generate a test mode signal and configured to receive output data. The semiconductor system may include a second semiconductor device configured to enter a test mode, based on the test mode signal, and block the output data of data that is stored in redundancy memory cells connected to unrepaired redundancy word lines which are not used among redundancy word lines provided for replacing failed word lines.

Growing community of inventors

Icheon-si, South Korea

Young Hyun Baek