Techwing Co., Ltd.

Young-Ho Kweon

Yun-Sung Na

In-Gu Jeon

Dong-Hyun Yo

Jong Ki Noh

Hoyung-Su Kim

In accordance with an embodiment of the present invention, there is provided a circulation method of a test tray in a test handler, the method comprising: in case of a first mode of test of temperature condition, firstly circulating the test tray along a first circulation path; and in case of a second mode of test of temperature condition different from the first mode, secondly circulating the test tray along a second circulation path, wherein the first circulation path and the second circulation path are different from each other in the transfer direction of the test tray at least in some sections.

Test handler and circulation method of test trays in test handler

A system and method is disclosed that transfers carrier boards in a handler that supports the testing of electronic devices. A carrier board can be transferred from the transfer start position to one of the mid transfer positions and the transfer final position. Carrier boards, which are spaced apart from each other in a chamber, can be gathered adjacent to each other in the circulation direction of carrier board. The transfer speed and the total circulation speed of the carrier boards can be enhanced. The transfer speed of carrier board can be easily controlled according to the test conditions.

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Anseong-si, South Korea

Young-Ho Kweon