Samsung Electronics Co., Ltd.

Young-Doo Yoo

Deuk-Soo Jung

Hong-shin Jun

An interface device according to the present invention interfaces with a host by an m-bit unit. A flag signal generator circuit generates a mode flag signal indicating whether a data transfer mode of the interface device is a multi-transfer mode. A control circuit operates responsive to information indicating whether an address from the host is a data width aligned address and whether the address thus transmitted belongs to a data width aligned address range. The control circuit causes m-bit data from the host to be continuously stored in a first-in first-out memory. Data continuously stored in the memory is at once transmitted to a high-speed bus connected to the interface device.

Interface device having variable data transfer mode and operation method thereof

A semiconductor device including a built-in redundancy analysis (BIRA) circuit for simultaneously testing and analyzing failures of a plurality of memories, and a failure analyzing method, includes a plurality of memory blocks, a plurality of built-in redundancy analysis units for outputting a group of failure repairing information signals by testing and analyzing a corresponding memory block among the plurality of memory blocks in response to common driving signals and each of independent selection signals, and a controller for generating the common driving signals and the respective independent selection signals in response to a plurality of externally applied control signals and sequentially receiving and sequentially outputting the group of failure repairing information signals generated from the respective built-in redundancy analysis units. According to the semiconductor device and the failure analyzing method, it is possible to reduce the test time and expense since a plurality of memories having different sizes can be simultaneously tested and analyzed.

SEMICONDUCTOR DEVICE INCLUDING BUILT-IN REDUNDANCY ANALYSIS CIRCUIT FOR SIMULTANEOUSLY TESTING AND ANALYZING FAILURE OF A PLURALITY OF MEMORIES AND METHOD FOR ANALYZING THE FAILURE OF THE PLURALITY OF MEMORIES

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Suwon-shi, South Korea

Young-Doo Yoo