Analog Devices,inc.

Bfly Operations, Inc.

Youn-Jae Kook

Nevada J Sanchez

Kailiang Chen

Ronald Alan Kapusta

Joseph Lutsky

Hamid Soleimani

Leung Kin Chiu

Chao Chen

Sebastian Schaetz

Jihee Lee

Dipak Sengupta

Jianrong Chen

Jose Barreiro Silva

Yeonsung Kim

Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.

Methods and circuitry for built-in self-testing of circuitry and/or transducers in ultrasound devices

Various embodiments of an integrated device package with integrated antennas are disclosed. In some embodiments, an antenna can be defined along a die pad of the package. In some embodiments, an antenna can be disposed in a first packaging component, and an integrated device die can be disposed in a second packaging component. The first and second packaging components can be stacked on one another and electrically connected. In some embodiments, a package can include one or a plurality of antennas disposed along a wall of a package body. The plurality of antennas can be disposed facing different directions from the package.

Packaged devices with integrated antennas

Systems and techniques are described for matching the resonance frequencies of multiple resonators. In some embodiments, a resonator generates an output signal reflecting the resonator's response to an input drive signal and an input noise signal. The output signal is then compared to the noise signal to derive a signal representative of the resonance frequency of the resonator. Comparing that signal to the output signal of a second resonator gives an indication of whether there is a difference between the resonance frequencies of the two resonators. If there is, one or both of the resonators may be adjusted. In this manner, the resonance frequencies of resonators may be matched during normal operation of the resonators.

Mode-matching of MEMS resonators

An apparatus for limiting the bandwidth of an amplifier provides for the design of an input impedance, a feedback impedance, and a load impedance such that the load impedance is proportional to the sum of the input impedance and feedback impedance. A sampling circuit has a load impedance including a resistor and capacitor in series to reduce the effective amplifier transconductance, which decreases bandwidth without increasing noise density or making this circuit more difficult to drive than a conventional circuit.

Bandwidth limiting for amplifiers

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Winchester, MA, United States of America

Youn-Jae Kook