Panalytical B.v.

Malvern Panalytical B.v.

Youhong Xiao

Charalampos Zarkadas

Ian Torquels Campbell

Lieven Kempenaers

Bruno Vrebos

This application relates to apparatus and method for x-ray fluorescence analysis. There is provided an X-ray fluorescence analysis apparatus for analysing a sample, The X-ray fluorescence analysis apparatus comprises an X-ray source, a measurement chamber for holding the sample in air, and an X-ray detector. The X-ray source is arranged to irradiate the sample with a primary X-ray beam, to cause the sample to fluoresce. The X-ray detector is arranged to detect characteristic X-rays emitted by the sample and to determine a measured X-ray intensity associated with the characteristic X-rays. An X-ray filter, which transmits the primary X-ray beam, is arranged between the X-ray source and the sample. The X-ray source comprises an anode of material having an atomic number that is less than 25. The X-ray fluorescence analysis apparatus further comprises a sensor arrangement configured to sense air pressure and air temperature. A processor receives the measured X-ray intensity. The processor also receives air pressure data and air temperature data from the sensor arrangement. The processor is configured to carry out a compensation calculation for adjusting the measured X-ray intensity using the air pressure data and the air temperature data.

Apparatus and method for x-ray fluorescence analysis

A two or three part sample holder for X-ray apparatus has a sample ringand a counter ring. The sample ringhas two opposed surfaces and foilsone on each surface holding a powder samplewithin the central hole. The sample ringis relatively thin, of thickness 0.2 to 4 mm. A counter ringis provided to engage with the sample ringto provide increased strength and/or stiffness.

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Almelo, Netherlands

Youhong Xiao