Skhynix Inc.

You Min Ji

Seon Ju Lee

Keun Woo Lee

Da Seul Lee

A memory system and a method of operating the memory system are provided. The memory system may determine, on a determination that the memory system enters thermal throttling mode, a target status read check period based on threshold voltage distribution offset for the target memory die, and set a timer to transmit a status read command for the target memory die to the memory device based on the target status read check period.

Memory system and operating method determining target status read check period in thermal throttling mode

A memory controller having an improved operation speed controls a memory device including a plurality of memory blocks. The memory controller includes: a remaining count determiner configured to determine a remaining count that is a number of program and erase operations to be additionally performed in the memory device based on a program/erase count received from the memory device, a retention period calculator configured to determine a retention period based on a power-off time and a power-on time of the memory device and a read voltage determiner configured to generate a changed read voltage table based on a default read voltage table and a coefficient determined according to the remaining count, and determine a read voltage to be used in the memory device according to the retention period among read voltages included in the changed read voltage table.

Growing community of inventors

Gyeonggi-do, South Korea

You Min Ji