Sony Semiconductor Solutions Corporation

Yotaro Mori

Makoto Kitagawa

Haruhiko Terada

Yoshiyuki Shibahara

Jun Okuno

Riichi Nishino

A semiconductor device according to an embodiment of the present disclosure includes: a memory cell array including a plurality of first selection lines extending in a first direction, a plurality of second selection lines extending in a second direction, and a plurality of memory cells each provided between the plurality of first selection lines and the plurality of second selection lines; a voltage generator that is configured to generate a selection voltage to be applied to one of the plurality of first selection lines; and a decoder section that includes a plurality of selection transistors and a gate driving section, and selects one of the plurality of first selection lines and applies the selection voltage to the selected first selection line, the plurality of selection transistors each provided in a plurality of selection paths coupling the plurality of first selection lines and the voltage generator, the gate driving section that drives gates of the plurality of transistors and is configured to apply a first driving voltage to the gates of the plurality of transistors, the first driving voltage being a positive voltage exceeding a withstand voltage of the plurality of selection transistors.

Semiconductor device and method of controlling the same

Provided is a memory module which includes a controller which, upon reception of a read command including a logical address, converts the logical address included in the read command into a physical address using address lookup information. The controller further inputs a first physical address, which is a portion of the physical address obtained by the conversion, to a non-volatile memory via a first address bus terminal, and then inputs a second physical address, which is a rest of the physical address obtained by the conversion, to the non-volatile memory via a second address bus terminal, to thereby read data corresponding to the physical address obtained by the conversion from the non-volatile memory.

Memory module

A memory apparatus includes a memory cell disposed at an intersection of a first wiring line and a second wiring line, and including a variable resistor and a selector, the variable resistor having a resistance state that changes to a first resistance state and a second resistance state, and a drive circuit that writes data to the memory cell by changing the variable resistor from the first resistance state to the second resistance state, and erases the data stored in the memory cell by changing the variable resistor from the second resistance state to the first resistance state. When erasing the data, the drive circuit changing in a stepwise manner a voltage applied to the memory cell, and changing in a stepwise manner a current limit value that limits a magnitude of a current flowing through the memory cell.

Memory apparatus and method of controlling memory apparatus

In a memory unit according to an embodiment of the present disclosure, a memory cell array is configured, when, of a plurality of memory cells, multiple first memory cells whose corresponding fourth wiring line and first wiring line are different from one another are simultaneously accessed, to allow for simultaneous access to the multiple first memory cells, without allowing for simultaneous access to memory cells corresponding to the fourth wiring line shared by the first memory cells.

Memory unit

A storage device according to the present disclosure includes: a plurality of first wiring lines extending in a first direction and including a plurality of first selection lines and a plurality of second selection lines; a plurality of second wiring lines extending in a second direction and including a plurality of third selection lines and a plurality of fourth selection lines, the second direction intersecting the first direction; a plurality of first memory cells; a first driver including a first selection line driver that drives the plurality of first selection lines on a basis of a first selection control signal and a second selection line driver that drives the plurality of second selection lines on a basis of the first selection control signal, the first and second selection line drivers being arranged side-by-side in the first direction; and a second driver including a third selection line driver that drives the plurality of third selection lines on a basis of a second selection control signal and a fourth selection line driver that drives the plurality of fourth selection lines on a basis of the second selection control signal, the third and fourth selection line drivers being arranged side-by-side in the second direction.

Storage device for storing data using a resistive random access storage element

A non-volatile memory device of the disclosure includes a memory cell, a writing circuit, and a current controller. The memory cell is disposed at an intersection of a first wiring and a second wiring, and includes a variable resistance element having a resistance state that is variable between a first resistance state and a second resistance state. The writing circuit varies the variable resistance element from the first resistance state to the second resistance state, and thereby performs writing of data on the memory cell. The current controller controls a current and thereby limits the current to a predetermined limit current value. The current is caused to flow through the first wiring or the second wiring by the writing circuit upon performing of the writing of the data. The current controller causes the predetermined limit current value to be a first limit current value in a period before a time at which the variable resistance element is varied to the second resistance state, and varies the predetermined limit current value from the first limit current value to a second limit current value after the time at which the variable resistance element is varied to the second resistance state.

Non-volatile memory device and method of controlling non-volatile memory device

A non-volatile memory device of the present disclosure includes: a plurality of bit lines; a plurality of word lines; a memory cell array having a plurality of memory cells each including a non-volatile storage element and being disposed at crossing sections of the bit lines and the word lines; a reference voltage generator circuit that generates a readout reference voltage serving as a reference for discrimination of data values stored on the memory cells; a readout circuit that reads the data values stored on the memory cells by detecting values of readout voltages from the memory cells relative to the readout reference voltage in a state where a predetermined current-limited readout current is applied to the bit lines; and an address compensation circuit that changes the readout reference voltage in accordance with a placement position of a memory cell to be read of the memory cells in the readout circuit.

Non-volatile memory device with variable readout reference

A memory device of one embodiment of the technology includes: a plurality of memory cells in a matrix arrangement; a plurality of row wirings each coupled to one end of each memory cell; a plurality of column wirings each coupled to another end of each memory cell, a first decoder circuit coupled to each of the row wirings of even-numbered rows; a second decoder circuit coupled to each of the row wirings of odd-numbered rows; a third decoder circuit coupled to each of the column wirings of even-numbered columns; and a fourth decoder circuit coupled to each of the column wirings of odd-numbered columns. The first decoder circuit, the second decoder circuit, the third decoder circuit, and the fourth decoder circuit are constituted by independent circuits from one another.

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Kanagawa, Japan

Yotaro Mori