Olympus Corporation

Evident Corporation

Yosuke Tani

Akihiro Fujii

Takahiko Kakemizu

Tatsuo Nakata

Takashi Yoneyama

Takahiro Furukawa

Masayoshi Karasawa

Madoka Ito

Kazuhiro Kan

Akifumi Kabeya

Shodai Hosono

Tsukasa Nittono

Chika Nakamoto

Yoshihiro Toigawa

Sho Makita

Hirofumi Hori

Takayuki Komiya

Yuki Arai

A microscope system includes: a microscope optical system that includes an ocular lens and forms an optical image of a sample on an object side of the ocular lens; a processor that generates auxiliary image data based on information regarding a target slide selected from among a plurality of ordered slides included in a slide set; and a superimposing device that superimposes, based on the auxiliary image data, an auxiliary image including the target slide on an image plane on which the optical image is formed. The processor selects, in response to an instruction to switch the target slide, a slide determined according to a first order in which the plurality of slides are ordered as a new target slide.

Microscope system, superimposing unit, and operation method

A measurement system includes: an optical measurement instrument that measures a surface of a specimen; and a control apparatus that controls the measurement instrument. The control apparatus includes: one or more non-transitory computer-readable media that include an instruction; and one or more processors that execute the instruction. The instruction is configured to cause the one or more processors to execute an operation. The operation includes: causing the measurement instrument to repetitively measure the surface of the specimen without changing the setting; and evaluating appropriateness of the setting for measuring surface texture of the specimen, based on comparison between a measurement value of the surface texture of the specimen calculated from a measurement data item output from the measurement instrument, and a degree of variation in measurement by the measurement instrument calculated from a plurality of measurement data items output from the measurement instrument.

Measurement system, measurement support method, and computer-readable medium

A microscope system includes an eyepiece, an objective, a tube lens that is disposed between the eyepiece and the objective, a projection apparatus that projects a projection image onto an image plane on which an optical image is formed by the tube lens, and a processor that performs processes. The processes include performing for digital image data of the sample at least one analysis process selected from a plurality of analysis processes, and generating projection image data representing the projection image on the basis of the analysis result and the at least one analysis process. The projection image data indicates the analysis result in a display format including an image color corresponding to the at least one analysis process. The generating the projection image data includes determining a color for the projection image in accordance with the at least one analysis process selected from the plurality of analysis processes.

Microscope system and projection unit

A scanning confocal microscope apparatus includes: a scanning confocal microscope that includes an objective lens; a computing device that divides a range in a direction of an optical axis of the objective lens of a preliminary scanning area on which preliminary scanning has been performed into a plurality of groups, in accordance with data obtained by performing the preliminary scanning using the scanning confocal microscope; and a controller that controls the scanning confocal microscope so as to perform principal scanning in which at least a portion of the preliminary scanning area is scanned under a measurement condition determined for each of the plurality of groups.

Scanning confocal microscope apparatus, scanning control method, and recording medium

A scanning microscope includes a two-dimensional scanning device that includes a first scanner and a second scanner for scanning, in oscillation motion and with light, a sample in directions orthogonal to each other, the first scanner scanning the sample at a speed higher than a speed of the second scanner, and a scan controller that controls the two-dimensional scanning device.

Scanning microscope

A technology is provided that makes it possible for even a beginner to determine whether a measurement result is correct, to thereby prevent the use of incorrect measurement data, and to improve the reliability of an analysis result. In a three-dimensional shape measurement apparatusthat measures a three-dimensional shape of a specimenin a non-contacting manner, a score that evaluates the reliability of measurement data is calculated for each measurement point by use of information obtained during a process of estimating the height of the specimenor the estimated height. Measurement data is processed according to a result of evaluating the measurement data for each measurement point by use of the score.

Three-dimensional shape measurement apparatus

A magnifying observation apparatus includes a switching unit for switching between a plurality of microscopies, an image generating unit for generating an image of a sample by capturing an image of the sample with the respective plurality of microscopies switched by the switching unit, and a display unit for displaying the image generated by the image generating unit. The display unit updates a display of the display unit each time a new image is generated by the image generating unit.

Magnifying observation apparatus, and image display method and microscopy switching method thereof

A microscope system includes a microscope frame on which a stage is placed; and a camera head, in which an objective lens is attachable, for capturing an image of a specimen, the camera head being attached to the microscope frame by being fitted, and being slidable with respect to the microscope frame in a direction that is parallel with a surface of the stage placed on the microscope frame and orthogonal to an optical axis of the attached objective lens.

Microscope system and microscope frame

A microscope system and an illumination intensity adjusting method that can automatically adjust an illumination intensity when a bright-field illumination system and a dark-field illumination system are simultaneously used are provided. The microscope system includes: a stage on which a specimen is placed; an objective lens that converges observation light from at least the specimen S on the stage; a bright-field illumination unit configured to emit bright-field illumination light that is illumination light aperture to the specimen for a bright-field observation; a dark-field illumination unit configured to emit dark-field illumination light that is illumination light aperture to the specimen for a dark-field observation; and an illumination intensity control unit configured to adjust an illumination intensity of at least one of the bright-field illumination light and the dark-field illumination light according to the illumination intensity of the other one.

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Tokyo, Japan

Yosuke Tani