Konica Minolta, Inc.

Yosuke Takebe

Yoshihisa Abe

Takafumi Komatsu

Wataru Yamaguchi

Since both gloss and a reflection characteristic are measured by one surface characteristic measurement device, a gloss measurement target area and a reflection characteristic measurement target area are appropriately set. A gloss measurement instrument and a color measurement instrument are integrated with a gloss colorimeter. The gloss measurement instrument illuminates an illumination target face by illumination light, receives reflected light generated by a regular reflection of the illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the gloss measurement target area can be changed. The color measurement instrument illuminates the illumination target face by annular illumination light, receives reflected light generated by a reflection of the annular illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the reflection characteristic measurement target area can be changed.

Surface characteristic measurement device

A surface inspection device includes an opening defining an aperture plane, one or more optical transceivers, and a processor. Each optical transceiver includes a light emitter and a light receiver that are arranged in different directions with respect to the aperture plane when viewed from above a virtual normal line of the aperture plane. The processor acquires detection values from the optical transceivers and calculates an evaluation value of a degree of variation in the detection values.

Growing community of inventors

Osaka, Japan

Yosuke Takebe