Denso Corporation

Yosuke Okitsu

Junji Sugiura

A control device for controlling a load drive semiconductor element for driving a load has a test operation mode for measuring a leak current of the load drive semiconductor element. In the test operation mode, a control terminal of the load drive semiconductor element is electrically separated from a power source or a ground by turning off another semiconductor element. Therefore, no electric current flows from the power source to the control terminal or from the control terminal to the ground. Therefore, the leak current of the load drive semiconductor element can be easily measured, even after the load drive semiconductor element is electrically connected to the control device for fabricating one-packaged IC.

Device for controlling a semiconductor element

In a load drive control system containing a control apparatus and a drive apparatus which drives a load in accordance with a drive control signal supplied from the control apparatus, a single signal produced from the control apparatus serves both as the drive control signal and as a power supply enabling control signal for the drive apparatus, without the need to provide an internal DC power supply in the drive apparatus. A switching element in the drive apparatus is controlled to apply a supply voltage from a drive power source to circuits in the drive apparatus only while the drive control signal is being supplied from the control apparatus.

Growing community of inventors

Kariya, Japan

Yosuke Okitsu