Average Co-Inventor Count = 1.49
ph-index = 10
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Sony Corporation (29 from 58,130 patents)
2. Sony Electronics Inc (5 from 2,335 patents)
3. Sony Computer Entertainment Inc. (3 from 1,799 patents)
4. International Business Machines Corporation (1 from 164,197 patents)
5. Toshiba America Electronic Components, Inc. (1 from 58 patents)
6. Sony Group Corporation (3,458 patents)
32 patents:
1. 11313784 - Microparticle sorting device, and method and program for sorting microparticles
2. 11193874 - Micro-particle sorting apparatus and method of determining a trajectory of an ejected stream carrying micro-particles
3. 10876954 - Microparticle sorting apparatus and delay time determination method
4. 10859996 - Microchip-type optical measuring apparatus and optical position adjusting method thereof
5. 10732090 - Fine particle analyzing apparatus, fine particle analyzing method, program, and fine particle analyzing system
6. 10646866 - Microparticle measurement device and liquid delivery method in microparticle measurement device
7. 10309891 - Particle sorting apparatus, particle sorting method, and program
8. 10241025 - Microparticle sorting device, and method and program for sorting microparticles
9. 10180676 - Microchip-type optical measuring apparatus and optical position adjusting method thereof
10. 10132735 - Microparticle sorting device and method of optimizing fluid stream therein
11. 9958375 - Microparticle sorting apparatus and delay time determination method
12. 9915935 - Microchip-type optical measuring apparatus and optical position adjusting method thereof
13. 9857286 - Particle fractionation apparatus, particle fractionation method and particle fractionation program
14. 9784660 - Microparticle sorting device, and method and program for sorting microparticles
15. 9669403 - Microparticle measurement device and liquid delivery method in microparticle measurement device