Nec Corporation

Asm IP Holding B.v.

Konica Minolta, Inc.

Yosuke Kimura

Yasuhiro Nakamura

Nana Jumonji

Chisato Sugawara

Viljami J Pore

Hideaki Fukuda

Dieter Pierreux

Dai Ishikawa

Bert Jongbloed

Werner Knaepen

David Kurt De Roest

Kunitoshi Namba

Gaku Nakano

Akiko Kobayashi

Kiyohiro Matsushita

Wataru Adachi

Kazuki Inagaki

Yuki Muramatsu

Mutsuhiro Akahane

Kazuya Osada

Tomohiko Satsuka

Maiko Hasegawa

A deterioration diagnosis device according to the present invention includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations include: storing a history of deterioration degree in a portion to be diagnosed in a structure; calculating a deterioration speed of the portion based on the history; acquiring reference information to be used to calculate an inspection frequency; calculating an inspection frequency for the portion based on the reference information and the deterioration speed; and outputting the calculated frequency.

Deterioration diagnosis device, deterioration diagnosis method, and recording medium

A state determination device according to the present invention includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations including: combining output from a plurality of determination models for an input image of a road, the plurality of determination models each learned using training data in which at least one of a state of a moving object mounting an imaging device that acquires an image of the road, a state of the road, and an external environment is different.

State determination device, state determination method and recording medium

A degradation display system according to an aspect of the present disclosure includes: at least one memory configured to store instructions, and at least one processor configured to execute the instructions to perform: acquiring a degradation index indicating a degradation state of a road section, changing display form of a map in accordance with a display range and a scale of the map, and superimposing degradation information on the map, the degradation information based on the degradation index of an area on the map or the road section in the area, wherein the superimposing includes: superimposing, for each area, the degradation information in a display form corresponding to a degree of the degradation index of the area in a case that the map is at a first scale, and superimposing, for each road section, the degradation information in a display form corresponding to a degree of the degradation index of the road section in a case that the map is at a second scale larger than the first scale.

Degradation display system, degradation display method, and recording medium

A person specifying device includes an authentication unit configured to acquire a captured image capturing a person boarding a moving vehicle, to perform a matching determination as to whether or not the person reflected in the captured image matches a pre-registered person, and to generate person-specifying information representing the person determined via the matching determination; and an authentication-interval-updating unit configured to update a time interval for performing the matching determination to be shorter when failing to achieve a success frequency of authentication above a desired value via the matching determination.

Person specifying device, person specifying method, and recording medium

Control deviceof an ultrasound diagnostic apparatus includes a hardware processor that sets, among a plurality of operation modes in which pulse waveforms of ultrasound pulses to be transmitted are different from one another, at least first and second operation modes for which observation results are to be simultaneously displayed on a screen, sets at least one operation type that defines transmission timing of ultrasound pulses, and sets a switching frequency of a switching signal.

Control device of ultrasound diagnostic apparatus and control method for ultrasound diagnostic apparatus

An ultrasound diagnostic apparatus includes an ultrasound probe and a display. The apparatus includes a power supply including at least one voltage converting circuit converting input voltage to a predetermined power voltage for output. The voltage converting circuit includes a coil and a switching element performing a switching operation for switching routes of current flowing in the coil in response to a predetermined switching control signal, and the voltage converting circuit outputs the power voltage through the repeated switching operations under supply of the input voltage. The power supply is provided with a plurality of coils, and the coils are disposed such that a leakage magnetic field in a vicinity of an aperture of at least one of the coils is partially negated by a leakage magnetic field from one or more of the other coils.

Ultrasound diagnostic apparatus

The present invention is intended to reduce the consumption of a battery while appropriately performing operation in the case where an AC power source is disconnected and power supply is switched to the battery. An ultrasonic diagnostic apparatus including: an AC adapter connection detecting section () that detects whether the ultrasonic diagnostic apparatus is electrically connected with the AC power source; and a display section (), wherein, when the AC adapter connection detecting section () detects that the AC power source is disconnected, power supply is switched to power supply from the battery (), and an operation screen for controlling an amount of the power supply in the ultrasonic diagnostic apparatus is displayed on the display section ().

Ultrasonic diagnostic apparatus and method of controlling ultrasonic diagnostic apparatus

Methods of depositing boron and carbon containing films are provided. In some embodiments, methods of depositing B, C films with desirable properties, such as conformality and etch rate, are provided. One or more boron and/or carbon containing precursors can be decomposed on a substrate at a temperature of less than about 400&#xb0; C. One or more of the boron and carbon containing films can have a thickness of less than about 30 angstroms. Methods of doping a semiconductor substrate are provided. Doping a semiconductor substrate can include depositing a boron and carbon film over the semiconductor substrate by exposing the substrate to a vapor phase boron precursor at a process temperature of about 300&#xb0; C. to about 450&#xb0; C., where the boron precursor includes boron, carbon and hydrogen, and annealing the boron and carbon film at a temperature of about 800&#xb0; C. to about 1200&#xb0; C.

Deposition of boron and carbon containing materials

A method for forming on a substrate a doped silicon oxide film with a cap film, includes: forming an arsenosilicate glass (ASG) film as an arsenic (As)-doped silicon oxide film on a substrate; continuously treating a surface of the ASG film with a treating gas constituted by Si, N, and H without excitation; and continuously forming a silicon nitride (SiN) film as a cap film on the treated surface of the ASG film.

Method for forming film having low resistance and shallow junction depth

A method for repairing process-related damage of a dielectric film includes: (i) adsorbing a first gas containing silicon on a surface of the damaged dielectric film without depositing a film in the absence of reactive species, (ii) adsorbing a second gas containing silicon on a surface of the dielectric film, followed by applying reactive species to the surface of the dielectric film, to form a monolayer film thereon, and (iii) repeating step (ii). The duration of exposing the surface to the first gas in step (i) is longer than the duration of exposing the surface to the second gas in step (ii).

Method for repairing damage of dielectric film by cyclic processes

A method for repairing process-related damage of a dielectric film formed on a substrate caused by processing the dielectric film includes: irradiating the damaged dielectric film with UV light in an atmosphere of hydrocarbon-containing gas to restore the surface of the dielectric film; and irradiating the surface-restored dielectric film with UV light in an atmosphere of oxygen gas to partially remove the hydrocarbon film.

Growing community of inventors

Tokyo, Japan

Yosuke Kimura