Nikon Corporation

Yosuke Fujikake

Shigeru Nakayama

Yuki Terui

A microscope includes: illumination optical system irradiating specimen with light and forming fringe illumination; scanning part performing scanning with relative movement between fringe illumination and specimen; phase modulation element setting fringe illumination to a plurality of phase states; a plurality of detectors detecting light from specimen; and image processor generating output image with detection results of predetermined two or more detectors, wherein image processor uses detection results of each of predetermined two or more detectors to generate at least first image, which is detected when fringe illumination is in first phase state, and second image, which is detected when fringe illumination is in second phase state, for each detector, generates intermediate image for each detector by correcting first image and second image based on position of corresponding detector, period of fringe illumination, first phase, and second phase, and generates output image from the plurality of intermediate images.

Microscope

To acquire an image of a sample. A microscope includes: an illumination optical system that includes a light flux splitter that splits light from a light source into a plurality of light fluxes, and scans a sample in a plurality of directions with interference fringes generated by interference of at least part of the light fluxes split by the light flux splitter; a detection optical system on which light from the sample is incident; a detection device that includes a plurality of detectors that detect the light from the sample via the detection optical system; and an image processor that generates an image using detection results of two or more of the detectors of the detection device.

Growing community of inventors

Tokyo, Japan

Yosuke Fujikake